Advances in Imaging and Electron Physics
- 1st Edition, Volume 176 - March 28, 2013
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 4 0 8 1 4 2 - 0
- eBook ISBN:9 7 8 - 0 - 1 2 - 4 1 6 6 0 9 - 7
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Series Page
Preface
Future Contributions
Foreword
Contributors
Chapter One. Early History of Wien Filters
1 Wilhelm Wien and his Wien Filter
2 Up to 1950s: Applications to a Part of Mass Analyzers
3 After the 1960s: The First Application to Electrons
4 A Brief History of the Theory of Wien Filters
5 About This Book
Chapter Two. Aberration Theory of the Wien Filter
1 Preliminary Remarks
2 Zeroth-Order Wien Filter
3 Stigmatic Wien Filters
4 Homogeneous Fields Wien Filters
5 First-order Wien Filters
6 Relativistic Charged Particle Paths in Wien Filters
Chapter Three. Wien Filter Instrumentation
1 Iron-free Coils
2 Generation of Quadrupole Fields
3 Double-Focus Wien Filter
4 Comments on the Wien Condition
5 Effect of Retarding Field
Chapter Four. Simulation of Multipole Wien Filters
1 Multipole Wien Filters
2 Previous Simulation Work on Multipole Wien Filters
3 Estimation of Voltages and Ampere-Turns
4 Simulation of an Equal-Arch, 8-Pole Wien Filter
5 Simulation of Equal-Arch, 12-Pole Wien Filter
6 Simulation of Different-Arch, 8-pole Wien Filter
7 A Different-Arch, 12-pole Wien filter
Chapter Five. Wien Filter Applications to Ions
1 Wien Filters as Independent Mass Analyzers
2 Double-Focusing Mass Spectrometers
3 Wien Filter in Accelerator Mass Spectrometry
4 Micro Wien Filters as Leak Detectors
5 Wien Filters for Radioactive Ions
6 Reaction Product Separators
7 Multiple Wien Filters
Chapter Six. Application of Wien Filters to Electrons
1 Monochromators and Analyzers
2 Beam Separator
3 Wien Spin Rotator
4 Wien Electron Phase Shifter
5 Wien Aberration Corrector
6 Wien Filter Without Dipoles
References
Index
Contents of Volumes 151-175
Color Plates
- Edition: 1
- Volume: 176
- Published: March 28, 2013
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect