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Advances in Imaging and Electron Physics

  • 1st Edition, Volume 176 - March 16, 2013
  • Latest edition
  • Editor: Peter W. Hawkes
  • Language: English

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more

Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of contents

Series Page

Preface

Future Contributions

Foreword

Contributors

Chapter One. Early History of Wien Filters

1 Wilhelm Wien and his Wien Filter

2 Up to 1950s: Applications to a Part of Mass Analyzers

3 After the 1960s: The First Application to Electrons

4 A Brief History of the Theory of Wien Filters

5 About This Book

Chapter Two. Aberration Theory of the Wien Filter

1 Preliminary Remarks

2 Zeroth-Order Wien Filter

3 Stigmatic Wien Filters

4 Homogeneous Fields Wien Filters

5 First-order Wien Filters

6 Relativistic Charged Particle Paths in Wien Filters

Chapter Three. Wien Filter Instrumentation

1 Iron-free Coils

2 Generation of Quadrupole Fields

3 Double-Focus Wien Filter

4 Comments on the Wien Condition

5 Effect of Retarding Field

Chapter Four. Simulation of Multipole Wien Filters

1 Multipole Wien Filters

2 Previous Simulation Work on Multipole Wien Filters

3 Estimation of Voltages and Ampere-Turns

4 Simulation of an Equal-Arch, 8-Pole Wien Filter

5 Simulation of Equal-Arch, 12-Pole Wien Filter

6 Simulation of Different-Arch, 8-pole Wien Filter

7 A Different-Arch, 12-pole Wien filter

Chapter Five. Wien Filter Applications to Ions

1 Wien Filters as Independent Mass Analyzers

2 Double-Focusing Mass Spectrometers

3 Wien Filter in Accelerator Mass Spectrometry

4 Micro Wien Filters as Leak Detectors

5 Wien Filters for Radioactive Ions

6 Reaction Product Separators

7 Multiple Wien Filters

Chapter Six. Application of Wien Filters to Electrons

1 Monochromators and Analyzers

2 Beam Separator

3 Wien Spin Rotator

4 Wien Electron Phase Shifter

5 Wien Aberration Corrector

6 Wien Filter Without Dipoles

References

Index

Contents of Volumes 151-175

Color Plates

Product details

  • Edition: 1
  • Latest edition
  • Volume: 176
  • Published: March 16, 2013
  • Language: English

About the editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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