Advances in Imaging and Electron Physics
- 1st Edition, Volume 177 - April 30, 2013
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more
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Description
Description
Key features
Key features
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Readership
Readership
Table of contents
Table of contents
Editor-In-Chief
Preface
Future Contributions
Contributors
Chapter One. Image Segmentation in the Field of the Logarithmic Image Processing Model: Special Focus on the Hierarchical Ascendant Classification Techniques
1 Introduction: Chapter Context and Aim
2 Multithresholding and K-Means
3 Region Growing
4 Hierarchical Ascendant Classification
5 Conclusion and Perspectives
6 Reflections on the LIP Model
References
Chapter Two. Representations for Morphological Image Operators and Analogies with Linear Operators
1 Introduction
2 Linear Spaces and Linear Image Operators
3 Lattice Spaces and Morphological Image Operators
4 Minimax Algebra and Image Operators on Complete Weighted Lattices
5 Kernel and Basis Representations of Operators on Lattices
6 Conclusions
References
Chapter Three. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections
1 Early Years
2 Research with Professor Oatley
3 Research with Ellis Cosslett at the Cavendish Laboratory
4 Epilogue
References
Chapter Four. Advanced Methods of Electron Microscopy in Catalysis Research
1 Introduction
2 STEM and TEM
3 Examples of Applications to Catalyst Characterization
4 Electron Microscopy of Layered Materials
References
Color Plates
Index
Contents of Volumes 151-176
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 177
- Published: April 30, 2013
- Language: English
About the editor
About the editor
PH