Advances in Imaging and Electron Physics
- 1st Edition, Volume 177 - May 23, 2013
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Editor-In-Chief
Preface
Future Contributions
Contributors
Chapter One. Image Segmentation in the Field of the Logarithmic Image Processing Model: Special Focus on the Hierarchical Ascendant Classification Techniques
1 Introduction: Chapter Context and Aim
2 Multithresholding and K-Means
3 Region Growing
4 Hierarchical Ascendant Classification
5 Conclusion and Perspectives
6 Reflections on the LIP Model
References
Chapter Two. Representations for Morphological Image Operators and Analogies with Linear Operators
1 Introduction
2 Linear Spaces and Linear Image Operators
3 Lattice Spaces and Morphological Image Operators
4 Minimax Algebra and Image Operators on Complete Weighted Lattices
5 Kernel and Basis Representations of Operators on Lattices
6 Conclusions
References
Chapter Three. Electron Microscopy at Cambridge University with Charles Oatley and Ellis Cosslett: Some Reminiscences and Recollections
1 Early Years
2 Research with Professor Oatley
3 Research with Ellis Cosslett at the Cavendish Laboratory
4 Epilogue
References
Chapter Four. Advanced Methods of Electron Microscopy in Catalysis Research
1 Introduction
2 STEM and TEM
3 Examples of Applications to Catalyst Characterization
4 Electron Microscopy of Layered Materials
References
Color Plates
Index
Contents of Volumes 151-176
- Edition: 1
- Latest edition
- Volume: 177
- Published: May 23, 2013
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect