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Advances in Imaging and Electron Physics

  • 1st Edition, Volume 178 - June 8, 2013
  • Latest edition
  • Editor: Peter W. Hawkes
  • Language: English

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more

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Description

Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of contents

Editor-in-Chief

Preface

Future Contributions

Contributors

Chapter One. Generalized Axiomatic Scale-Space Theory

1 Introduction

2 Image Measurements and the Notion of Scale

3 Structural Assumptions of Scale-Space Theory

4 Scale-Space Axioms for Spatial Image Domains

5 Scale-Space Concepts for Spatial Image Domains

6 Scale-Space Axioms for Spatiotemporal Image Domains

7 Scale-Space Concepts for Spatiotemporal Image Domains

8 Temporal Smoothing Kernels

9 History of Axiomatic Scale-Space Formulations

10 Summary and Conclusions

Acknowledgments

References

Chapter Two. Smoothlet Transform: Theory and Applications

1 Introduction

2 Smoothlets

3 Smoothlet Transform

4 Image Compression

5 Image Denoising

6 Summary

References

Chapter Three. Theory and Computation of Electron Mirrors: The Central Particle Method

1 Introduction

2 Systems with a Straight Optical Axis

3 Axially Symmetric Charged-Particle Optical Systems

4 Time-of-Flight Mass Spectrometer

5 Electron Microscope Objective with an Electron Mirror

6 Summary and Conclusions

Acknowledgments

References

Color Plates

Index

Contents of Volumes 151-177

Product details

  • Edition: 1
  • Latest edition
  • Volume: 178
  • Published: June 8, 2013
  • Language: English

About the editor

PH

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

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