Advances in Imaging and Electron Physics
- 1st Edition, Volume 170 - January 25, 2012
- Imprint: Academic Press
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 3 9 4 3 9 6 - 5
- eBook ISBN:9 7 8 - 0 - 1 2 - 3 9 7 8 4 3 - 1
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Precession Electron Diffraction1. Introduction2. Precession Electron Diffraction: Geometry and Diffracted Intensities3. Structure Solution Using Precession Electron Diffraction4. Applications and New Developments of PED5. ConclusionsAcknowledgmentsScanning Helium Ion Microscopy1. Introduction2. Scanning Helium Ion Microscope3. Applications4. Future Developments5. ConclusionAcknowledgmentsSignal Reconstruction Algorithm Based on a Single Intensity in the Fresnel Domain1. Introduction2. Theory3. The Recursive Algorithm4. Numerical Results5. ConclusionsAcknowledgmentsElectron Microscopy Studies on Magnetic L10-Type FePd Nanoparticles1. Introduction2. Experimental Procedures3. Atomic Ordering and Hard Magnetic Properties4. Determination of Order Parameter by Electron Diffraction5. Atomic Structure Imaging of Nanoparticles6. 3D Shapes and Distribution of Nanoparticles7. Concluding RemarksAcknowledgmentsFundamental Aspects of Near-Field Emission Scanning Electron Microscopy1. Introduction2. Instrumentation3. Experimental Results4. Lensless Focusing5. Summary and OutlookAcknowledgments
- Edition: 1
- Volume: 170
- Published: January 25, 2012
- No. of pages (Hardback): 280
- No. of pages (eBook): 280
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780123943965
- eBook ISBN: 9780123978431
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect