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Advances in Imaging and Electron Physics
- 1st Edition, Volume 171 - May 15, 2012
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 3 9 4 2 9 7 - 5
- eBook ISBN:9 7 8 - 0 - 1 2 - 3 9 4 6 3 5 - 5
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This se… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
- Thermal Imaging in Medicine
- Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
- Imaging Mass Spectrometry – Sample Preparation, Instrumentation and Applications
- Transformation Optics
- TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
- Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics
G. Esser, W. Becken, W. Müller, P. Baumbach, J. Arasa, D. Uttenweiler
Lila Iznita Izhar and Maria Petrou
Jean-Michel Tualle
Kamlesh Shrivas and Mitsutoshi Setou
Robert T. Thompson and Steven A. Cummer
Tobias Klein, Egbert Buhr and Carl Georg Frase
M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah
- No. of pages: 440
- Language: English
- Edition: 1
- Volume: 171
- Published: May 15, 2012
- Imprint: Academic Press
- Hardback ISBN: 9780123942975
- eBook ISBN: 9780123946355
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect