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Advances in Imaging and Electron Physics
1st Edition - June 30, 2011
Editor: Peter W. Hawkes
Hardback ISBN:
9 7 8 - 0 - 1 2 - 3 8 5 9 8 5 - 3
eBook ISBN:
9 7 8 - 0 - 1 2 - 3 8 5 9 8 6 - 0
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series… Read more
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- A History of Cameca (1954–2009)
- 1. Genealogy of Cameca
- 2. From Radio-Cinéma to Cameca (1954)
- 3. The MS46, First Microprobe Designed at Cameca (1964)
- 4. Launching the SMI 300 (1968)
- 5. The Adult Age (1975)
- 6. Taking Wing (1987)
- 7. Predominance of Sims (1990–2000)
- 8. Star Dusts and Fab Dusts (2000)
- 9. Ametek and the Atom Probe (2007)
- 10. Epilogue
- 11. Appendices
- Theory and Applications of General Adaptive Neighborhood Image Processing
- 1. Introduction
- 2. Preliminaries of GANIP
- 3. GAN-Based Mathematical Morphology
- 4. GAN-Based Choquet Filtering
- 5. GAN-Based Distance Transforms
- 6. Application Issues
- 7. Concluding Discussion and Perspectives
- Acknowledgments
- Shape Recognition Based on Eigenvalues of the Laplacian
- 1. Introduction
- 2. Related Work
- 3. Eigenvalues of the Dirichlet and Neumann Laplacians
- 4. The Clamped Plate and Buckling of a Clamped Plate Problems
- 5. Lessons from Simple Shapes
- 6. Computation of the Eigenvalues
- 7. Features Based on the Eigenvalues of the Various Problems Considered
- 8. Artificial Neural Networks
- 9. Experimental Results
- 10. Conclusion
- Acknowledgments
- Point Set Analysis
- 1. Introduction
- 2. Motivation, Related Issues, and Notations
- 3. A New Spectrum of Shapes for UPS Analysis
- 4. Applications of Mesh Morphological Operators
- 5. Discussion
- 6. Conclusions and Future Research
- Image Recovery from Sparse Samples, Discrete Sampling Theorem, and Sharply Bounded Band-Limited Discrete Signals
- 1. Introduction: Sparse Sampling
- 2. Discrete Sampling Theorem
- 3. Algorithms for Signal Recovery from Sparse Sampled Data
- 4. Analysis of Transforms
- 5. Selection of Transform for Image Band-Limited Approximation
- 6. Application Examples
- 7. Sharply Band-Limited Discrete Signals with Sharply Limited Support
- 8. Conclusion
- No. of pages: 360
- Language: English
- Published: June 30, 2011
- Imprint: Academic Press
- Hardback ISBN: 9780123859853
- eBook ISBN: 9780123859860
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France