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Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
- 1st Edition, Volume 162 - June 30, 2010
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 3 8 1 3 1 6 - 9
- eBook ISBN:9 7 8 - 0 - 1 2 - 3 8 1 3 1 7 - 6
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This se… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
1. Energy Filtered X-ray Photoemission electronmicroscopy(EXPEEM)- Kiyotaka Asakura
2. Image contrast in aberration-corrected scanningconfocal electron microscopy- E.C. Cosgriff
3. Comparison of color demosaicing methods- O. Lossona
4. New dimensions for field emission: effects of structure in the emitting surface- C. J. Edgcombe
5. Conductivity Imaging and Generalised RadonTransform: a review- Archontis Giannakidis
6. Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy- A. Sever Škapin
- No. of pages: 296
- Language: English
- Edition: 1
- Volume: 162
- Published: June 30, 2010
- Imprint: Academic Press
- Hardback ISBN: 9780123813169
- eBook ISBN: 9780123813176
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