Advances in Imaging and Electron Physics
- 1st Edition, Volume 164 - November 2, 2010
- Imprint: Academic Press
- Editor: Peter W. Hawkes
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 3 8 1 3 1 2 - 1
- eBook ISBN:9 7 8 - 0 - 1 2 - 3 8 1 3 1 3 - 8
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This se… Read more
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Request a sales quoteAdvances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
- Magnetolithography - from the Bottom-Up Route to High Throughput – Amos Bardea and Ron Naaman
- The Optics of the Spatial Coherence Wavelets – Román Castañeda
- Common Diffraction Integral Calculation Based on Fast Fourier Transform Algorithm – LI Junchang, WU Yanmei and LI Yan
- A generalized approach to describe the interference contrast and the phase contrast method – Marcel Teschke and Stefan Sinzinger
- Nonlinear partial differential equations for noise problems – Booyong Choi
- Harmuth Corrigenda - Henning Harmuth
- Edition: 1
- Volume: 164
- Published: November 2, 2010
- No. of pages (Hardback): 392
- No. of pages (eBook): 392
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780123813121
- eBook ISBN: 9780123813138
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect