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Advances in Imaging and Electron Physics
The Scanning Transmission Electron Microscope
1st Edition - November 5, 2009
Editor: Peter W. Hawkes
Hardback ISBN:9780123749864
9 7 8 - 0 - 1 2 - 3 7 4 9 8 6 - 4
eBook ISBN:9780080961583
9 7 8 - 0 - 0 8 - 0 9 6 1 5 8 - 3
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series… Read more
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Updated with contributions from leading international scholars and industry experts
Discusses hot topic areas and presents current and future research trends
Provides an invaluable reference and guide for physicists, engineers and mathematicians
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
The beginnings and development of the scanning transmission electron microscope (STEM) Albert V. Crewe STEM in the life sciences Andreas Engel The AEI and Siemens STEM instruments Peter Hawkes STEM in Japan Hiromi Inada Early work on the STEM Michael S. Isaacson The Toulouse high-voltage STEM project Bernard Jouffrey Aberration-corrected STEM Ondrej Krivanek STEM in Cambridge K.C.A. Smith A review of the cold field electron cathode Lyn Swanson and Greg Schwind STEM in Oxford and at Vacuum Generators Sebastian von Harrach The Vacuum Generators STEM Ian Wardell and Peter Bovey Historical background of the STEM at Brookhaven National Laboratory Joseph Wall
No. of pages: 320
Language: English
Published: November 5, 2009
Imprint: Academic Press
Hardback ISBN: 9780123749864
eBook ISBN: 9780080961583
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France