Advances in Imaging and Electron Physics
The Scanning Transmission Electron Microscope
- 1st Edition, Volume 159 - November 5, 2009
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series… Read more
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Description
Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Key features
Key features
- Updated with contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Provides an invaluable reference and guide for physicists, engineers and mathematicians
Readership
Readership
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Table of contents
Table of contents
The beginnings and development of the scanning transmission electron microscope (STEM)
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall
Albert V. Crewe
STEM in the life sciences
Andreas Engel
The AEI and Siemens STEM instruments
Peter Hawkes
STEM in Japan
Hiromi Inada
Early work on the STEM
Michael S. Isaacson
The Toulouse high-voltage STEM project
Bernard Jouffrey
Aberration-corrected STEM
Ondrej Krivanek
STEM in Cambridge
K.C.A. Smith
A review of the cold field electron cathode
Lyn Swanson and Greg Schwind
STEM in Oxford and at Vacuum Generators
Sebastian von Harrach
The Vacuum Generators STEM
Ian Wardell and Peter Bovey
Historical background of the STEM at Brookhaven National Laboratory
Joseph Wall
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 159
- Published: November 5, 2009
- Language: English
About the editor
About the editor
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceView book on ScienceDirect
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