Advances in Imaging and Electron Physics
- 1st Edition, Volume 97 - October 4, 1996
- Latest edition
- Editors: Peter W. Hawkes, Benjamin Kazan, Tom Mulvey
- Language: English
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy.… Read more
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Description
Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Readership
Readership
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Table of contents
Table of contents
R. Navarro, A. Tabernero, and G. Cristobal, Image Representaton with Gabor Wavelets and Its Applications. L. Bedini, I. Gerace, E. Salerno, and A. Tonazzini, Models and Algorithms for Edge-Preserving Image Reconstruction. E.A.B. da Silva and D.G. Sampson, Successive Approximation Wavelet Vector Quantization for Image and Video Coding. R. Jagannathan and S.A. Khan, Quantum Theory of the Optics of Charged Particles. J. Ximen, Ultrahigh-Order Canonical Aberration Calculation and Integration Transformation in Rotationally Symmetric Magnetic and Electrostatic Lenses. Appendix. Chapter References. Subject Index.
Review quotes
Review quotes
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."—MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." —J.A. Chapman in LABORATORY PRACTICE
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." —J.A. Chapman in LABORATORY PRACTICE
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 97
- Published: December 2, 1996
- Language: English
About the editors
About the editors
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceBK
Benjamin Kazan
Affiliations and expertise
Xerox Corporation, Palo Alto, California, U.S.A.TM
Tom Mulvey
Affiliations and expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.View book on ScienceDirect
View book on ScienceDirect
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