Advances in Imaging and Electron Physics
- 1st Edition, Volume 95 - March 14, 1996
- Latest edition
- Editors: Peter W. Hawkes, Tom Mulvey, Benjamin Kazan
- Language: English
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 5 7 7 6 1 - 6
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy.… Read more
Advances in Imaging and Electron Physics is the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computingmethods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
L. Lambert and T. Mulvey, Ernst Ruska (1906–1988), Designer Extraordinaire of the Electron Microscope: A Memoir. V.T. Binh, N. Garcia, and S.T. Purcell, Electron Field Emission from Atom-Sources: Fabrication, Properties, and Applications of Nanotips. P.L. Combettes, The Convex Feasibility Problem in Image Recovery. C. Doran, A. Lasenby, S. Gull, S. Somaroo, and A. Challinor, Spacetime Algebra and Electron Physics. H.C. Shen and D. Srivastava,Texture Representation and Classification: The Feature Frequency Matrix Approach. Chapter References. Subject Index.
- Edition: 1
- Latest edition
- Volume: 95
- Published: March 14, 1996
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceTM
Tom Mulvey
Affiliations and expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.BK
Benjamin Kazan
Affiliations and expertise
Xerox Corporation, Palo Alto, California, U.S.A.Read Advances in Imaging and Electron Physics on ScienceDirect