Advances in Imaging and Electron Physics
Silicon-Based Millimetre-wave Technology
- 1st Edition, Volume 174 - November 1, 2012
- Latest edition
- Editor: Jamal Deen
- Language: English
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This… Read more
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Description
Description
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key features
Key features
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Readership
Readership
Table of contents
Table of contents
Editor-In-Chief
Preface
Future Contributions
Foreword
Contributors
Acknowledgements
Permission Acknowledgments
Chapter One. Measurement Techniques and Issues
1. Introduction
2. Overview of Measurement Methods and Instrumentation
3. Transmission Line and S-Parameters
4. Millimeter-Wave Network Analyzers
5. Cascading of S-Parameters and Transmission/Transfer T-Parameters
6. Calibration and De-Embedding at MM-Waves
References
Chapter Two. Transmission Lines and Passive Components
1. Introduction
2. Silicon Integrated Circuits and Technology
3. Transmission Lines
4. Electromagnetics of Transmission Lines and Their Discontinuities
5. Transitions
6. Capacitors, Inductors, and Resistors
7. Resonators and Filters for Silicon Integrations of Increased Frequencies
8. Power Dividers And Directional Couplers for SI-Integrated Circuits
9. Packaging of Millimeter-Wave Components and Chips
10. Conclusions
References
Chapter Three. Modeling and Design of High-Frequency Structures Using Artificial Neural Networks and Space Mapping
1. Introduction to Artificial Neural Networks
2. Structure of Artificial Neural Networks
3. Activation Functions
4. Aspects of Artificial Neural Network Training
5. Applications of Artificial Neural Networks to Modeling of on-Chip High-Frequency Devices
6. Introduction to Space Mapping
7. The Space Mapping Concept
8. The Parameter Extraction Step
9. Space Mapping Approaches
10. Space Mapping Optimization and Modeling
11. Applications of Space Mapping
12. Conclusions
References
Chapter Four. Nanoscale FETs
1. Types and Performances of Nanoscale MOSFETs
2. Small-Signal Analysis of MOSFETs at High Frequencies
3. HF Noise Modeling of Multiple-Gate SOI and Laterally Asymmetric Channel MOS Devices
4. Conclusions
References
Chapter Five. RF MEMS Devices for Communication Systems
1. Introduction
2. General Design Considerations
3. MEMS Redundancy Switch Matrices
4. RF MEMS Crossbar Switch Matrices
5. RF MEMS Switch Matrices with Pairwise Connection
6. Switch Matrices for High-Power Applications
7. Tunable RF MEMS Components
8. Discussion
References
Chapter Six. Substrate-Integrated Antennas on Silicon
1. Introduction
2. Some Antenna Fundamentals
3. Fabrication of Antennas on Silicon Substrates
4. Types of Silicon-Based Integrated Antennas
5. Integrated Antenna Measurements
6. Crosstalk and Circuit Noise
7. Effect of Silicon Substrate Resistivity on Antenna Transmission Gain
8. Applications in Wireless Personal Area Networks (WPANS)
9. Single-Chip Radio
10. Photonically Reconfigurable Antennas
11. Carbon Nanotube (CNT) Antennas
12. Vehicular Applications
References
Color Plates
Subject Index
Contents of Volumes 151-173
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 174
- Published: November 1, 2012
- Language: English
About the editor
About the editor
JD