Advanced Metrology
Freeform Surfaces
- 1st Edition - April 8, 2020
- Authors: X. Jane Jiang, Paul J. Scott
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 8 2 1 8 1 5 - 0
- eBook ISBN:9 7 8 - 0 - 1 2 - 8 2 1 8 1 6 - 7
Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclus… Read more
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Advanced Metrology: Freeform Surfaces provides the perfect guide for engineering designers and manufacturers interested in exploring the benefits of this technology. The inclusion of industrial case studies and examples will help readers to implement these techniques which are being developed across different industries as they offer improvements to the functional performance of products and reduce weight and cost.
- Includes case studies in every chapter to help readers implement the techniques discussed
- Provides unique advice from industry on hot subjects, including surface description and data processing
- Features links to online content, including video, code and software
Researchers, graduate students and practicing engineers in manufacturing, metrology, precision engineering, engineering design, computer-aided engineering, industrial engineering, aerospace engineering and automotive engineering
1. Introduction2. Fundaments for Freeform Surfaces3. Sampling for Freeform Surfaces4. Freeform Surface Fitting5. Linear and Non-linear Diffusion Filtration6. Morphological Filtration7. Wavelets Filtration8. Segmentation of Features on Freeform Surfaces9. Characterisation for Freeform Surfaces10. Characterisation of Freeform Structured Surfaces11. Freeform Surface Design and Metrology Platform12. Summary and Conclusion
- Edition: 1
- Published: April 8, 2020
- Language: English
XJ
X. Jane Jiang
Professor Dame Jane Jiang is a Royal Academy of Engineering/Renishaw Chair in Precision Metrology, and the Director of the UK National Hub for Future Metrology.
Jane’s research interests include the development of mathematical models and algorithms for geometrical products specification and metrology, including geometric tolerancing, and surface texture analytics, filtration and parametric characterization; and development of new optical interferometry techniques for future embedded measurement sensor and instrumentation. She devotes her research on underpinning manufacturing science, especially in the creation of infrastructure in geometrical products design, processing control, verification in manufacturing. Jane has published more than 450 papers; 10 books and journal special issues on measurement science and manufacturing research. Jane is a Fellow of the Royal Academy of Engineering, a Fellow of the International Academy of Production Research and the Institute of Engineering Technology. She was awarded a Royal Society Wolfson Research Merit Award in 2006 and the Sir Harold Hartley Medal in 2014 and received a Damehood in the 2017 Queen’s Birthday Honours, for her services to engineering and manufacturing.
Affiliations and expertise
Royal Academy of Engineering/Renishaw Chair in Precision Metrology, University of Huddersfield, and Director of the UK National Hub for Future Metrology, UKPS
Paul J. Scott
Professor Paul J. Scott holds the Taylor Hobson Chair in Computational Geometry, at the University of Huddersfield, with a research focus on mathematics, algorithms, and the geometrical characterisation of size, shape and texture. Paul spent twenty-six years in the research department at Taylor Hobson Ltd, applying mathematical ideas and concepts to surface texture and form measuring instruments. He is still employed by TH for one day a week. Paul is also very actively involved with the formation of national and international standards: being chairman of BSI technical committee TDE/4/-/9 and represents the UK on ISO technical committee TC/213 (Dimensional and geometrical product specification and verification-GPS).
Affiliations and expertise
Taylor Hobson Chair in Computational Geometry, University of Huddersfield, UKRead Advanced Metrology on ScienceDirect