Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. All contributions are subject to peer review by leading experts in the field. Special issues are devoted to significant international conferences, or to important developing topics.Microelectron... Reliability is an indispensable forum for the exchange of knowledge and experience between microelectronics reliability professionals from both academic and industrial environments, and all those associated in any way with a steadily growing microelectronics industry and its many fields of application.
Solid State Communications also welcomes full length original research articlesSolid State Communications publishes short communications and original research articles on significant developments in condensed matter science and materials physics, that emphasis original experimental and theoretical research on the physical and chemical properties of not only solids but also other condensed systems.The submission of manuscripts reporting research on the basic physics of materials and devices, as well as of state-of-the-art microstructures and nanostructures, is encouraged.A coherent quantitative treatment emphasizing new physics is expected rather than a simple accumulation of experimental and/or theoretical data.Consistent with these aims, the short communications should be kept concise and short, not longer than six printed pages. The number of figures and tables should also be kept to a minimum. Original research articles have no length restrictions.(Visit the Guide for Authors for more detailed information.)The Fast-Track section of Solid State Communications is the venue for very rapid publication of short communications on significant developments in condensed matter science and materials physics. The goal is to offer the broad condensed matter community quick and immediate access to publish recently completed papers in research areas that are rapidly evolving and in which there are developments with great potential impact.Keywords: condensed matter physics, materials physics, materials chemistry, materials science, electronic properties and devices, magnetism, superconductivity, microstructures, nanostructures
