Materials Characterization

An International Journal on Materials Structure and Behavior

Materials Characterization features original articles and state-of-the-art reviews on theoretical and practical aspects of the structure and behaviour of materials.

The Journal focuses on all characterization techniques, including all forms of microscopy (light, electron, acoustic, etc.,) and analysis (especially microanalysis and surface analytical techniques). Developments in both this wide range of techniques and their application to the quantification of the microstructure of materials are essential facets of the Journal.

The Journal provides the Materials Scientist/Engineer with up-to-date information on many types of materials with an underlying theme of explaining the behavior of materials using novel approaches. Materials covered by the journal include:

Please note that not all topics fall within the scope of Materials Characterization. Submissions focused on the topics listed below will not be considered for publication, potential alternative journals are indicated in brackets:

i) thin film semiconductors (Thin Solid Films; Materials Science in Semiconductor Processing)
ii) polymers or polymer composites (Elsevier polymer titles; Composites structures)
iii) mechanical, electrical or other property measurements without any accompanying microstructural characterization (depending on the focus, please consider submitting to Corrosion Science; Wear; Materials Science & Engineering B; Materials & Design)
iv) computation, theory or analysis papers without an accompanying microstructural characterization component (Computational Materials Science; Materials Science & Engineering A; Materials Science & Engineering B; Materials Science & Engineering C)