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Vacuum Ultraviolet Spectroscopy II
- 1st Edition, Volume 32 - September 4, 1998
- Editors: Thomas Lucatorto, James A. Samson, David L. Ederer, Marc De Graef
- Language: English
- eBook ISBN:9 7 8 - 0 - 0 8 - 0 8 6 0 2 2 - 0
This volume is for practitioners, experimentalists, and graduate students in applied physics, particularly in the fields of atomic and molecular physics, who work with vacuum… Read more
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Request a sales quoteThis volume is for practitioners, experimentalists, and graduate students in applied physics, particularly in the fields of atomic and molecular physics, who work with vacuum ultraviolet applications and are in need of choosing the best type of modern instrumentation. It provides first-hand knowledge of the state-of-the-art equipment sources and gives technical information on how to use it, along with a broad reference bibliography.
AUDIENCE: Experimental researchers, graduate students, and practitioners in applied physics, especially spectroscopic methods, optical sources in physics and engineering, and atomic and molecular physics who work in the field of vacuum ultraviolet applications.
Contributors. Volumes in the Series. Optical Systems: Monochromators and Spectrometers: M. Koike, Normal Incidence Monochromators. H.A. Padmore, M.R. Howells, and W.R. McKinney, Grazing Incidence Monochromators. J.H. Underwood, Spectrograph and Monochromators Using Varied Line Spacing Gratings. A.P. Thorne and M.R. Howells, Intermerometric Spectrometers. Detectors: J.B. West, Gas Detectors. L.R. Canfield, Photodiode Detectors. O.H.W. Siegmund, Amplifying and Position Sensitive Detectors. S.V. Bobashev, Absolute Flux Measurements. R.L. Stockbauer, Vacuum Techniques. Application: Y. Vladimirsky, Lithography. H. Ade, Spectromicroscopy. Spectroscopy: M. Ginter and K. Yoshino, Optical. T. Calcott, Fluorescence. Index.
- No. of pages: 307
- Language: English
- Edition: 1
- Volume: 32
- Published: September 4, 1998
- Imprint: Academic Press
- eBook ISBN: 9780080860220
TL
Thomas Lucatorto
Affiliations and expertise
National Institute of Standards and Technology, Gaithersburg, Maryland, U.S.A.JS
James A. Samson
Affiliations and expertise
University of Nebraska, Lincoln, U.S.A.DE
David L. Ederer
Affiliations and expertise
Tulane University, New Orleans, Louisiana, U.S.A.MD
Marc De Graef
Affiliations and expertise
Carnegie Mellon University, Pittsburgh, Pennsylvania, U.S.A.