The Beginnings of Electron Microscopy - Part 2

1st Edition, Volume 221 - April 26, 2022
Imprint: Academic Press
Editors: Peter W. Hawkes, Martin Hÿtch
Language: English
Hardback ISBN:
9 7 8 - 0 - 3 2 3 - 9 8 9 1 9 - 0
eBook ISBN:
9 7 8 - 0 - 3 2 3 - 9 8 9 2 0 - 6

The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presen… Read more

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The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917–1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

Cover image
Title page
Table of Contents
Copyright
Contributors
Foreword
Foreword to first edition
Preface by Ernst Ruska
Chapter One: Recollections from the early years: Canada–USA
Abstract
1. Introduction
2. Initial work: University of Toronto (1935–1936)
3. Kodak Research Laboratories, Rochester, New York (1937–1941)
4. Massachusetts Institute of Technology
5. Transition from the early years
6. Afterword by Peter Hawkes
References
Chapter Two: My recollection of the early history of our work on electron optics and the electron microscope
Abstract
1. Emission microscope
2. Studies of specimen techniques for electron microscopy
3. Electron-microscopic observations of ionic crystals
4. The pointed filament and its application
5. Interference and coherence
6. Afterword by Peter Hawkes
References
Chapter Three: Walter Hoppe — X-ray crystallographer and visionary pioneer in electron microscopy
Abstract
1. Introduction
2. Life
3. Work in X-ray crystallography
4. Structure research using electron microscopy
5. Electron tomography
6. Walter Hoppe remembered
Appendix to “Walter Hoppe — X-ray crystallographer and visionary pioneer in electron microscopy” by Joachim Frank
Acknowledgements
References
Chapter Four: Reminiscences of the development of electron optics and electron microscope instrumentation in Japan
Abstract
1. Historical survey of the early stages of electron microscopy in Japan
2. Lens aberrations
3. Practical magnetic lens design
4. Formation of caustic and shadow images
5. Stigmators
6. Electron phase microscope
7. High-voltage electron microscopes
8. Afterword by Peter Hawkes
References
Chapter Five: Early electron microscopy in the Netherlands
Abstract
1. Afterword by Pieter Kruit: about Jan Bart Le Poole (1917–1993)
References
Chapter Six: L. L. Marton, 1901–1979
Abstract
1. Bibliographical appendix: publications of L. L. Marton
2. Afterword by Peter Hawkes
References
Chapter Seven: The invention of the electron Fresnel interference biprism,
Abstract
1. Childhood years in Bielefeld
2. Gaining technical know-how as a student apprentice
3. A broad education in physics with Professor Walter Kossel
4. Influence of the work of Kikuchi and convergent beam diffraction
5. Electron-optical experiments with Brüche, Scherzer, and Mahl
6. Quantitative testing of the operation of the biprism
7. Measurement of the inner potential of solids
8. Electron interference microscope in the transmission mode
9. The intensity problem in electron interferometers
10. Atomic resolution electron holography
11. Editorial note
12. Afterword by Peter Hawkes
References
Chapter Eight: The industrial development of the electron microscope by the Metropolitan Vickers Electrical Company and AEI Limited
Abstract
1. Introduction
2. Cathode rays and electron images—Gabor and the ironclad concentration coil
3. The first commercial electron microscope—EM1
4. Wartime developments
5. The EM2 electron microscope
6. A three-stage electron microscope—EM3
7. A simple electron microscope—EM4
8. High-voltage electron microscopy—the EM5
9. Improving the resolving power—EM3A and the emergence of electron holography
10. High-resolution microscopes—EM6
11. The image intensifier
12. The electron microscope in biology
13. Very high-resolution microscopy
14. Afterword by Peter Hawkes
References
Chapter Nine: The development of the scanning electron microscope
Abstract
1. Introduction
2. The initial aims of the three groups
3. The Cambridge microscope
4. Uses of the microscope
5. Afterword by Peter Hawkes
Bibliography including cited references
Chapter Ten: Some recollections of electron microscopy in Britain from 1943 to 1948
Abstract
1. Afterword by Peter Hawkes
References
Chapter Eleven: Rudolf Rühle and the BOSCH electron microscope: another early commercial instrument
Abstract
1. Origins of electron microscopy in Berlin
2. First steps for the S&H instrument
3. The commercial Siemens & Halske magnetic electron microscope
4. The electrostatic electron microscope of the AEG
5. Competition between concepts, characters, and companies
6. The gifted entrepreneur: Baron Manfred von Ardenne
7. Development of electron microscopy inside the Bosch company
8. Rudolf Rühle (1907-2003): personal background and development
9. Rudolf Rühle: the technical engineer at Bosch
10. Walter Rentschler and the Bosch electron microscope
11. Rudolf Rühle's groundwork for the Bosch electron microscope
12. Rudolf Rühle's thesis: on the future Bosch electron microscope
13. Rebuilding of Germany after WWII
14. Foundation of the German society for electron microscopy
15. The commercial Bosch electron microscope
16. Promotion for the Bosch electron microscope
17. The Bosch electron microscope in Hohenheim
18. The Bosch-EM in Tübingen
19. Giving up the commercial electron microscope
20. A list of Rudolf Rühle's patents
Acknowledgements
References
Chapter Twelve: Otto Scherzer and his contributions to electron microscopy
Abstract
1. Introduction
2. Hans Busch, “the father of electron optics”
3. Otto Scherzer
Acknowledgements
References
Chapter Thirteen: 1950-1960: a decade from the viewpoint of an applications laboratory
Abstract
1. Introduction
2. Experience with testing a new microscope
3. A microscope with higher resolving power
4. Development and improvement of preparation methods
5. Teaching duties in an applications laboratory for electron microscopy
6. Final remarks
7. Afterword by the late Dipl.-Ing. Maren Heinzerling (Deutscher Akademikerinnenbund e.V.)
References
Chapter Fourteen: From the cathode-ray oscillograph to the high-resolution electron microscope
Abstract
1. Introduction
2. Developments up to the end of World War II
3. Period of transition
4. Improvements in the electron microscope after 1945
5. Concluding remarks
6. Afterword by Peter Hawkes
References
Chapter Fifteen: Reminiscences
Abstract
1. Afterword by Peter Hawkes
References
Chapter Sixteen: Complementary accounts of the history of electron microscopy
Abstract
1. Appendix
2. Afterword
Acknowledgements
Acknowledgements
References
Index

Peter W. Hawkes

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and expertise

Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France

Martin Hÿtch

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

Affiliations and expertise

Senior Scientist, French National Centre for Research (CNRS), Toulouse, France

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