Spectrophotometry
Accurate Measurement of Optical Properties of Materials
- 1st Edition, Volume 46 - June 24, 2014
- Latest edition
- Editors: Thomas A. Germer, Joanne C. Zwinkels, Benjamin K. Tsai
- Language: English
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter au… Read more
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Description
Description
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications.
Key features
Key features
- Written by the leading international experts from industry, government, and academia
- Written as a handbook, with in depth discussion of the topics
- Focus on making the most accurate and reproducible measurements
- Many practical applications and examples
Readership
Readership
Physicists, materials scientists, engineers and quality controllers who need to perform precise and accurate spectrophotometry of the optical properties of materials
Table of contents
Table of contents
Chapter 1: Introduction
- Abstract
- 1.1 Opening Remarks
- 1.2 Uncertainties
- 1.3 Overview
Chapter 2: Theoretical Concepts in Spectrophotometric Measurements
- Abstract
- 2.1 Introduction
- 2.2 Radiometric Quantities
- 2.3 Relationship Between Radiometric and Electromagnetic Quantities
- 2.4 The Spectrophotometric Quantities
- 2.5 Polarization
- 2.6 Reflection and Transmission from Flat Surfaces
- 2.7 Diffuse Scattering
Chapter 3: Dispersive Methods
- Abstract
- 3.1 Introduction
- 3.2 General Description
- 3.3 Spectral Analyzer Design
- 3.4 Wavelength Calibration
- 3.5 Stray Light
- 3.6 Optical Radiation Sources
- 3.7 Optical Radiation Detectors
Chapter 4: Fourier Transform Methods
- Abstract
- 4.1 Introduction: Ideal Michelson Interferometer
- 4.2 Real Fourier Transform Spectrometers
- 4.3 Sources of Uncertainty and Their Reduction
- 4.4 Measurement Applications
- 4.5 Recommendations for Accurate FTS Measurements
Chapter 5: Regular Reflectance and Transmittance
- Abstract
- 5.1 Introduction
- 5.2 Relevant Background Information
- 5.3 Measurements Near-Normal Incidence
- 5.4 Measurements at Oblique Incidence
- 5.5 Measuring the Reflectance of Highly Reflecting Materials
Chapter 6: Diffuse Reflectance and Transmittance
- Abstract
- 6.1 Introduction
- 6.2 Measurands
- 6.3 Notation of Diffuse Reflection Geometries
- 6.4 Integrating Spheres
- 6.5 Absolute Sphere Methods for Measuring Diffuse Reflection
- 6.6 Diffuse Reflection Standards
- 6.7 Relative Sphere Methods for Measuring Diffuse Reflection
- 6.8 Diffuse Transmittance Measurements
Chapter 7: Spectral Fluorescence Measurements
- Abstract
- 7.1 Introduction
- 7.2 Fundamental Concepts and Terminology
- 7.3 Measurement of Fluorescence Characteristics
- 7.4 General Instrument Design and Measurement Considerations
- 7.5 Specialized Instrument Designs and Measurement Methods
- 7.6 Instrument Characteristics That Impact Spectral Fluorescence Measurements
- 7.7 Sample Characteristics That Impact Fluorescence Measurements
- 7.8 Standards for Spectral Fluorescence Measurements
Chapter 8: Angle-Resolved Diffuse Reflectance and Transmittance
- Abstract
- 8.1 Introduction
- 8.2 Reference-Free Measurement Methods
- 8.3 Instrument Characterization
- 8.4 Goniometer Designs
- 8.5 Uncertainty Analysis
- 8.6 Normalization Schemes
- 8.7 Special Conditions or Considerations
- 8.8 Applications
Chapter 9: Spectral Emissivity Measurements
- Abstract
- 9.1 Introduction
- 9.2 Measurement Methods
- 9.3 Spectral Emissivity Measurements Near-Ambient Temperature
- 9.4 Spectral Emissivity and Reflectance Measurements of Oxidized Metals
- 9.5 Spectral Emissivity Measurements of Molten Metals at High Temperatures
- 9.6 Spectral Emissivity Measurements of Ceramics
Chapter 10: Color and Appearance
- Abstract
- 10.1 Introduction
- 10.2 Spectral Attributes—Color
- 10.3 Color-Measuring Instruments
- 10.4 Gonioapparent Materials
- 10.5 Geometrical Attributes
Chapter 11: The Use of Spectrophotometry in the Pharmaceutical Industry
- Abstract
- 11.1 Introduction
- 11.2 Introduction to the Pharmaceutical Industry
- 11.3 Quality System for the Analytical Laboratory
- 11.4 UV and Visible Spectrophotometry
- 11.5 NIR Spectrometry
- 11.6 Mid-IR Spectrometry
- 11.7 Fluorescence Spectrometry
- 11.8 Where Next?
Chapter 12: Spectrophotometry Applications: Remote Sensing
- Abstract
- 12.1 Introduction
- 12.2 Measurement of Atmospheric Carbon Dioxide
- 12.3 The Remote Sensing of Clouds in the Earth's Atmosphere
- 12.4 The Retrieval of Snow Properties
- 12.5 Volcanic Unrest
- 12.6 Calibration
- 12.7 Summary
- Acknowledgments
Chapter 13: Microspectrophotometry
- Abstract
- 13.1 Introduction
- 13.2 Microspectrophotometer Instrument Design and Construction
- 13.3 Using the MSP System
- 13.4 Current Applications of MSP in Industry and Research
- 13.5 Conclusion
Product details
Product details
- Edition: 1
- Latest edition
- Volume: 46
- Published: June 24, 2014
- Language: English
About the editors
About the editors
TG
Thomas A. Germer
JZ
Joanne C. Zwinkels
Joanne Zwinkels was a Principal Research Officer at the National Research Council of Canada (NRC), retired since February 2020. She is actively involved in international standardization activities and served more than a decade as the NRC representative to the Consultative Committee of Photometry and Radiometry (CCPR), Chair of the Strategic Planning Working Group of CCPR, and International Convenor of ISO TC6/WG3.
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