Spectrophotometry
Accurate Measurement of Optical Properties of Materials
- 1st Edition, Volume 46 - June 24, 2014
- Imprint: Academic Press
- Editors: Thomas A. Germer, Joanne C. Zwinkels, Benjamin K. Tsai
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 3 8 6 0 2 2 - 4
- eBook ISBN:9 7 8 - 0 - 1 2 - 3 8 6 0 2 3 - 1
This volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter au… Read more
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Request a sales quoteThis volume is an essential handbook for anyone interested in performing the most accurate spectrophotometric or other optical property of materials measurements. The chapter authors were chosen from the leading experts in their respective fields and provide their wisdom and experience in measurements of reflectance, transmittance, absorptance, emittance, diffuse scattering, color, and fluorescence. The book provides the reader with the theoretical underpinning to the methods, the practical issues encountered in real measurements, and numerous examples of important applications.
- Written by the leading international experts from industry, government, and academia
- Written as a handbook, with in depth discussion of the topics
- Focus on making the most accurate and reproducible measurements
- Many practical applications and examples
Physicists, materials scientists, engineers and quality controllers who need to perform precise and accurate spectrophotometry of the optical properties of materials
Chapter 1: Introduction
- Abstract
- 1.1 Opening Remarks
- 1.2 Uncertainties
- 1.3 Overview
Chapter 2: Theoretical Concepts in Spectrophotometric Measurements
- Abstract
- 2.1 Introduction
- 2.2 Radiometric Quantities
- 2.3 Relationship Between Radiometric and Electromagnetic Quantities
- 2.4 The Spectrophotometric Quantities
- 2.5 Polarization
- 2.6 Reflection and Transmission from Flat Surfaces
- 2.7 Diffuse Scattering
Chapter 3: Dispersive Methods
- Abstract
- 3.1 Introduction
- 3.2 General Description
- 3.3 Spectral Analyzer Design
- 3.4 Wavelength Calibration
- 3.5 Stray Light
- 3.6 Optical Radiation Sources
- 3.7 Optical Radiation Detectors
Chapter 4: Fourier Transform Methods
- Abstract
- 4.1 Introduction: Ideal Michelson Interferometer
- 4.2 Real Fourier Transform Spectrometers
- 4.3 Sources of Uncertainty and Their Reduction
- 4.4 Measurement Applications
- 4.5 Recommendations for Accurate FTS Measurements
Chapter 5: Regular Reflectance and Transmittance
- Abstract
- 5.1 Introduction
- 5.2 Relevant Background Information
- 5.3 Measurements Near-Normal Incidence
- 5.4 Measurements at Oblique Incidence
- 5.5 Measuring the Reflectance of Highly Reflecting Materials
Chapter 6: Diffuse Reflectance and Transmittance
- Abstract
- 6.1 Introduction
- 6.2 Measurands
- 6.3 Notation of Diffuse Reflection Geometries
- 6.4 Integrating Spheres
- 6.5 Absolute Sphere Methods for Measuring Diffuse Reflection
- 6.6 Diffuse Reflection Standards
- 6.7 Relative Sphere Methods for Measuring Diffuse Reflection
- 6.8 Diffuse Transmittance Measurements
Chapter 7: Spectral Fluorescence Measurements
- Abstract
- 7.1 Introduction
- 7.2 Fundamental Concepts and Terminology
- 7.3 Measurement of Fluorescence Characteristics
- 7.4 General Instrument Design and Measurement Considerations
- 7.5 Specialized Instrument Designs and Measurement Methods
- 7.6 Instrument Characteristics That Impact Spectral Fluorescence Measurements
- 7.7 Sample Characteristics That Impact Fluorescence Measurements
- 7.8 Standards for Spectral Fluorescence Measurements
Chapter 8: Angle-Resolved Diffuse Reflectance and Transmittance
- Abstract
- 8.1 Introduction
- 8.2 Reference-Free Measurement Methods
- 8.3 Instrument Characterization
- 8.4 Goniometer Designs
- 8.5 Uncertainty Analysis
- 8.6 Normalization Schemes
- 8.7 Special Conditions or Considerations
- 8.8 Applications
Chapter 9: Spectral Emissivity Measurements
- Abstract
- 9.1 Introduction
- 9.2 Measurement Methods
- 9.3 Spectral Emissivity Measurements Near-Ambient Temperature
- 9.4 Spectral Emissivity and Reflectance Measurements of Oxidized Metals
- 9.5 Spectral Emissivity Measurements of Molten Metals at High Temperatures
- 9.6 Spectral Emissivity Measurements of Ceramics
Chapter 10: Color and Appearance
- Abstract
- 10.1 Introduction
- 10.2 Spectral Attributes—Color
- 10.3 Color-Measuring Instruments
- 10.4 Gonioapparent Materials
- 10.5 Geometrical Attributes
Chapter 11: The Use of Spectrophotometry in the Pharmaceutical Industry
- Abstract
- 11.1 Introduction
- 11.2 Introduction to the Pharmaceutical Industry
- 11.3 Quality System for the Analytical Laboratory
- 11.4 UV and Visible Spectrophotometry
- 11.5 NIR Spectrometry
- 11.6 Mid-IR Spectrometry
- 11.7 Fluorescence Spectrometry
- 11.8 Where Next?
Chapter 12: Spectrophotometry Applications: Remote Sensing
- Abstract
- 12.1 Introduction
- 12.2 Measurement of Atmospheric Carbon Dioxide
- 12.3 The Remote Sensing of Clouds in the Earth's Atmosphere
- 12.4 The Retrieval of Snow Properties
- 12.5 Volcanic Unrest
- 12.6 Calibration
- 12.7 Summary
- Acknowledgments
Chapter 13: Microspectrophotometry
- Abstract
- 13.1 Introduction
- 13.2 Microspectrophotometer Instrument Design and Construction
- 13.3 Using the MSP System
- 13.4 Current Applications of MSP in Industry and Research
- 13.5 Conclusion
- Edition: 1
- Volume: 46
- Published: June 24, 2014
- Imprint: Academic Press
- No. of pages: 560
- Language: English
- Hardback ISBN: 9780123860224
- eBook ISBN: 9780123860231
TG
Thomas A. Germer
Thomas A. Germer received a B.A. in physics from the University of California, Berkeley in 1985. In 1992, he received a Ph.D. in physics from Cornell University in the field of surface electron spectroscopies and surface photochemistry. An interest in optics at surfaces led him to the National Institute of Standards and Technology (NIST), where he held a postdoctoral associateship from 1992 to 1995, performing research in picosecond and femtosecond time-resolved measurements of surface chemical and physical dynamics. He joined the NIST staff as a physicist in the 1995. Since then, he has led the NIST program on light scattering and diffraction from surfaces. His work has earned him the Department of Commerce Bronze and Silver awards, The NIST Chapter of Sigma Xi Young Scientist Award, and Fellow of the SPIE, and he has served as a topical editor for Applied Optics. He has published over 100 articles and has been granted two patents. He developed the SCATMECH library of scattering codes.
Affiliations and expertise
NIST, Gaithersburg, MD, USAJZ
Joanne C. Zwinkels
Joanne Zwinkels was a Principal Research Officer at the National Research Council of Canada (NRC), retired since February 2020. She is actively involved in international standardization activities and served more than a decade as the NRC representative to the Consultative Committee of Photometry and Radiometry (CCPR), Chair of the Strategic Planning Working Group of CCPR, and International Convenor of ISO TC6/WG3.
Affiliations and expertise
National Research Council Canada, Ontario, CanadaBT
Benjamin K. Tsai
From 1993 until 2023 Benjamin Tsai worked as a physical scientist at NIST (National Institute of Standards and Technology) with research projects including the spectral irradiance scale, rapid thermal processing of semiconductor devices, heat flux, skin reflectance, UV exposure of reflectance standards, and photometry (measurement assurance program and research for luminous flux of LEDs).
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