Skip to main content

Save up to 30% on Elsevier print and eBooks with free shipping. No promo code needed.

Save up to 30% on print and eBooks.

Quantitative Data Processing in Scanning Probe Microscopy

SPM Applications for Nanometrology

2nd Edition - January 24, 2018

Author: Petr Klapetek

Language: English
Paperback ISBN:
9 7 8 - 0 - 1 2 - 8 1 3 3 4 7 - 7
eBook ISBN:
9 7 8 - 0 - 1 2 - 8 1 3 3 4 8 - 4

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data proc… Read more

Quantitative Data Processing in Scanning Probe Microscopy

Purchase options

LIMITED OFFER

Save 50% on book bundles

Immediately download your ebook while waiting for your print delivery. No promo code is needed.

Institutional subscription on ScienceDirect

Request a sales quote

Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software.

Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap.

Associated data sets can be downloaded from http://gwyddion.net/qspm/