Optics of Charged Particles
- 2nd Edition - October 23, 2021
- Imprint: Academic Press
- Author: Hermann Wollnik
- Language: English
- Paperback ISBN:9 7 8 - 0 - 1 2 - 8 1 8 6 5 2 - 7
- eBook ISBN:9 7 8 - 0 - 1 2 - 8 2 1 4 6 6 - 4
Optics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field… Read more
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Request a sales quoteOptics of Charged Particles, 2nd edition, describes how charged particles move in the fields of magnetic and electrostatic dipoles, quadrupoles, higher order multipoles, and field-free regions. Since the first edition, published over 30 years ago, new technologies have emerged and have been used for new ion optical instruments like, for instance, time-of-flight mass analyzers, which are described now. Fully updated and revised, this new edition provides ways to design mass separators, spectrographs, and spectrometers, which are the key tools in organic chemistry and for drug developments, in environmental trace analyses and for investigations in nuclear physics like the search for super heavy elements as well as molecules in space science.
The book discusses individual particle trajectories as well as particle beams in space and in phase-space, and it provides guidelines for the design of particle optical instruments. For experienced researchers, working in the field, it highlights the latest developments in new ion optical instruments and provides guidelines and examples for the design of new instruments for the transport of beams of charged particles and the mass/charge or energy/charge analyses of ions. Furthermore, it provides background knowledge required to accurately understand and analyze results, when developing ion-optical instruments.
By providing a comprehensive overview of the field of charged particle optics, this edition of the book supports all those working, directly or indirectly, with charged-particle research or the development of ion- and electron-analyzing instruments.
- Provides enhanced, clear descriptions, and derivations making complex aspects of the general motion of charged particles understandable as well as features of charged particle analyzing instruments
- Assists the reader in applying insights obtained from the principles of charged particle optics to the design of new transporting and mass- or energy-analyzing instruments for ions
- Discusses new applications and newly occurring issues, which have arisen since the first edition
Anyone who needs an understanding of charged particle optics for their work, including physicists, chemists (particularly those in physical, theoretical and analytical chemistry), electronic device and materials developers needing an understanding or charged particle behaviour or using materials chemistry in their work, chemical engineers
- Cover image
- Title page
- Table of Contents
- Copyright
- Foreword to second edition
- Foreword
- Chapter one. Gaussian optics and transfer matrices
- Abstract
- 1.1 The method of transfer matrices
- 1.2 An optical system that contains one thin lens
- 1.3 General optical systems
- 1.4 Transfer matrices of lens multiplets
- 1.5 Round lenses for charged particles
- References
- Chapter two. General relations for the motion of charged particles in electromagnetic fields
- Abstract
- 2.1 Energy, velocity, and mass of accelerated charged particles
- 2.2 Forces on charged particles in electromagnetic fields
- 2.3 The description of a bundle of particles of different kinetic energies and masses
- 2.4 The refractive index of the electromagnetic field
- 2.5 The Euler–Lagrange equations
- Appendix
- References
- Chapter three. Quadrupole lenses
- Abstract
- 3.1 The electric and magnetic fields in quadrupole lenses
- 3.2 Particle trajectories in quadrupole lenses
- 3.3 The design of quadrupole multiplets
- 3.4 Thin-lens approximations for quadrupole multiplets
- References
- Chapter four. Sector fields
- Abstract
- 4.1 Homogeneous magnetic sector fields
- 4.2 Inhomogeneous magnetic sector fields formed by inclined planar pole faces (wedge magnets)
- 4.3 Radially inhomogeneous sector fields formed by conical pole faces or toroidal electrodes
- 4.4 Particle flight times in radially inhomogeneous sector fields, quadrupoles, and field-free regions
- Appendix
- References
- Chapter five. Charged particle beams in phase space
- Abstract
- 5.1 Liouville’s theorem and first-order transfer matrices
- 5.2 Phase-space areas of particle beams passing through optical systems
- 5.3 Beam envelopes
- 5.4 Positions and sizes of envelope minima
- 5.5 Minimal beam envelopes at postulated locations
- 5.6 Liouville’s theorem and its application to wide-angle beams
- 5.7 Beams with space charge
- References
- Chapter six. Particle beams in periodic structures
- Abstract
- 6.1 Single-particle trajectories and beam envelopes
- 6.2 Rings of unit cells
- References
- Chapter seven. Fringe fields
- Abstract
- 7.1 Particle trajectories in the fringe fields of dipole magnets
- 7.2 Particle trajectories in fringe fields of electrostatic deflectors
- 7.3 Particle trajectories in the fringe fields of quadrupole lenses
- References
- Chapter eight. Image aberrations
- Abstract
- 8.1 Systematics of image aberrations
- 8.2 Origin of image aberrations
- 8.3 Relations between coefficients of Eq. (8.2) due to the condition of symplecticity
- 8.4 Image aberrations of nth order
- Appendix
- References
- Chapter nine. Design of particle spectrometers and beam guide lines
- Abstract
- 9.1 Single-sector magnetic spectrometers
- 9.2 A quality factor for particle spectrometers
- 9.3 Time-of-flight particle spectrometers
- 9.4 The alignment of an optical system and the correction of its aberrations
- References
- Chapter ten. Time-of-flight mass spectrographs
- Abstract
- 10.1 Time-of-flight mass spectrographs that use sector fields
- 10.2 Time-of-flight mass spectrographs that use electrostatic sector fields
- 10.3 Low-energy ion beams in time-of-flight mass spectrographs
- 10.4 Accelerating and bunching of ions in pulsed electric fields
- 10.5 Energy-isochronous time-of-flight mass spectrographs that use ion mirrors
- 10.6 A multireflection time-of-flight mass spectrograph
- References
- Index
- Edition: 2
- Published: October 23, 2021
- Imprint: Academic Press
- No. of pages: 318
- Language: English
- Paperback ISBN: 9780128186527
- eBook ISBN: 9780128214664
HW
Hermann Wollnik
Prof. Hermann Wollnik’s work has taken him around the world and includes collaborations with the European Space Agency, the GSI research center in Darmstadt, Germany or with CERN in Geneva, Switzerland, with the Los Alamos and Oak Ridge National Laboratories in the United States as well as with the University of Osaka, Japan. After retiring from the Justus Liebig University in Giessen, Germany in 2001, he took up new collaborations with the New Mexico State University in Las Cruces, NM, United States and the GSFC of the NASA in Baltimore, MD, United States as well as with the KEK/RIKEN Research Institute in Tokyo, Japan.
Prof. Wollnik’s main scientific work has concentrated on mass determinations and, thus, nuclear binding energies of isotopes of short-lived heavy and super heavy elements as well as on the identification of organic molecules on the earth and space objects as for instance on a comet head in the ROSETTA space mission. Among many different ideas were new proposals and designs of energy-isochronous time-of-flight mass spectrographs, for high- and low-energy ions, the developments of which he started in the mid-1970s.
Affiliations and expertise
New Mexico State University, Las Cruces, USARead Optics of Charged Particles on ScienceDirect