Non-Destructive Material Characterization Methods
- 1st Edition - September 1, 2023
- Editors: Akira Otsuki, Seiko Jose, Manasa Mohan, Sabu Thomas
- Language: English
- Paperback ISBN:9 7 8 - 0 - 3 2 3 - 9 1 1 5 0 - 4
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 9 8 4 7 8 - 2
Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing m… Read more
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Request a sales quoteNon-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments.
From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis.
- Provides an overview of a wide-range of NDT material characterization methods, strengths and weaknesses of these methods, when to apply them, and more
- Includes eddy current sensing and imaging, ultrasonic sensing and imaging, RF and THz imaging, internet and cloud-based methods, among many others
- Presents case studies, applications and other insights on putting these methods into practice
- Cover image
- Title page
- Table of Contents
- Copyright
- List of contributors
- Preface
- Acknowledgments
- Chapter 1. Introduction to non-destructive material characterizations
- Abstract
- 1.1 Introduction
- 1.2 Non-destructive material characterization methods beyond the conventional non-destructive testings
- 1.3 Conclusions
- References
- Chapter 2. Optical microscope: interferometric and non-interferometric optical microscopy techniques
- Abstract
- 2.1 Introduction
- 2.2 Optical interferometry techniques
- 2.3 Optical non-interferometric techniques
- 2.4 Summary and future perspectives
- Acknowledgements
- References
- Chapter 3. Polarized microscopy
- Abstract
- 3.1 Introduction: basic principles and instrumentation
- 3.2 Sample preparation
- 3.3 Observations under crossed polarizers: interference colors
- 3.4 Crystallographic orientations and extinction positions
- 3.5 Compensators and retardation plates
- 3.6 Conoscopic observations
- 3.7 Observations with one polarizer: pleochroism, relief, Becke line
- 3.8 Summary and future perspectives
- References
- Chapter 4. Atomic force microscopy
- Abstract
- 4.1 Introduction and principle of atomic force microscopy
- 4.2 Surface characterization using atomic force microscopy
- 4.3 Measurements of interaction forces by atomic force microscopy
- 4.4 Summary and future outlook
- References
- Chapter 5. Non-destructive imaging of buried interfaces using decelerated electron-beam in scanning electron microscopy
- Abstract
- 5.1 Introduction
- 5.2 Principles
- 5.3 Electron flight simulation
- 5.4 Non-destructive imaging
- 5.5 Summary
- Acknowledgments
- References
- Further reading
- Chapter 6. Scanning probe microscope
- Abstract
- 6.1 Introduction
- 6.2 Working principles of scanning probe microscopes
- 6.3 Scanning probe microscope methods
- 6.4 Scanning probe microscope applications
- 6.5 Conclusion
- References
- Chapter 7. Transmission electron microscope
- Abstract
- 7.1 Introduction
- 7.2 Principle
- 7.3 Instrumentation
- 7.4 Features
- 7.5 Application
- References
- Chapter 8. Neutrons—characteristics and sources
- Abstract
- 8.1 Introduction
- 8.2 Neutron sources
- 8.3 Outlook and further perspectives
- References
- Chapter 9. Neutron imaging
- Abstract
- 9.1 Introduction
- 9.2 Principles of neutron imaging
- 9.3 Examples from neutron imaging studies
- 9.4 Outlook
- Acknowledgements
- References
- Chapter 10. Infrared thermography: philosophy, approaches, analysis—processing, and guidelines
- Abstract
- 10.1 Introduction
- 10.2 Data analysis
- 10.3 Modeling and simulation
- 10.4 Relevant standard
- 10.5 Case study
- 10.6 Conclusions
- References
- Chapter 11. Non-destructive material testing in welding: ultrasonic scanning
- Abstract
- 11.1 Introduction
- 11.2 Non-destructive characterization of welded parts—ultrasonic testing
- 11.3 Conclusions
- Acknowledgements
- References
- Further reading
- Chapter 12. Diffraction with X-rays and neutrons
- Abstract
- 12.1 Introduction
- 12.2 Interaction of X-rays with electrons (materials)
- 12.3 Data analysis: Patterson function
- 12.4 Surface/interface diffraction
- 12.5 Neutron diffraction
- References
- Chapter 13. Raman spectroscopy—part one
- Abstract
- 13.1 Introduction
- 13.2 Immersion in turbid media and reactive media
- 13.3 Conclusion
- References
- Chapter 14. Raman spectroscopy—part two
- Abstract
- 14.1 Introduction
- 14.2 Monitoring of a specific physical characteristic
- 14.3 Raman imaging
- 14.4 Field measurements
- 14.5 Conclusion
- References
- Chapter 15. UV–Vis spectroscopy in non-destructive testing
- Abstract
- 15.1 Preface
- 15.2 Introduction
- 15.3 Principles
- 15.4 UV–Vis spectroscopy analysis, absorption spectrum, and data analysis
- 15.5 Major applications of UV–Vis spectroscopy
- 15.6 UV–Vis spectroscopy as non-destructive testing tools
- 15.7 Advantages of UV–Vis spectrophotometry as non-destructive testing tool
- 15.8 Future potentials
- 15.9 Conclusion
- References
- Chapter 16. Hard X-ray photoelectron spectroscopy and X-ray diffraction techniques: non-destructive compositional, electronic, chemical and structural in-depth characterization in the tens-of-nanometer scale
- Abstract
- 16.1 Introduction
- 16.2 Physical principles
- 16.3 Excitation sources and instrumentation
- 16.4 Experimental methodology and selected application examples
- 16.5 Conclusion
- Acknowledgments
- References
- Chapter 17. X-ray fluorescence spectroscopy
- Abstract
- 17.1 Introduction
- 17.2 Basic principle
- 17.3 Detection systems
- 17.4 Samples preparation
- 17.5 Advantages and limitations
- 17.6 XRF instrumentation
- 17.7 Application of x-ray fluorescence spectroscopy
- 17.8 Summary
- References
- Chapter 18. Mass spectrometry
- Abstract
- 18.1 Introduction
- 18.2 Basic principle
- 18.3 Instrumentation
- 18.4 Sampling preparation
- 18.5 Data analysis
- 18.6 Major application
- 18.7 Relevant standards
- 18.8 Conclusion
- References
- Chapter 19. Atomic absorption spectrophotometry
- Abstract
- 19.1 The atomic spectra and their use in chemical analysis
- 19.2 The atomic absorption spectrophotometer
- 19.3 Interferences in atomic absorption spectrophotometry
- 19.4 Analysis using atomic absorption spectrophotometry
- 19.5 The future of atomic absorption spectrophotometry
- References
- Chapter 20. Dielectric spectroscopy and techniques
- Abstract
- 20.1 Introduction
- 20.2 Measurement techniques
- 20.3 Data-treatment
- 20.4 Summary
- References
- Further reading
- Chapter 21. Chemical analysis with neutrons
- Abstract
- 21.1 Introduction
- 21.2 Physical principles and theory
- 21.3 Instrumental neutron activation analysis
- 21.4 Prompt gamma activation analysis
- 21.5 Good laboratory practice, quality management for prompt gamma activation analysis and neutron activation analysis
- 21.6 Further methods
- 21.7 Characteristics and applications
- 21.8 Activation analysis facilities at research reactors
- 21.9 Outlook
- References
- Chapter 22. X-ray stress analysis
- Abstract
- 22.1 Introduction
- 22.2 Fundamentals of X-ray diffraction
- 22.3 Stress analysis
- 22.4 Summary
- References
- Chapter 23. Non-destructive testing of ferromagnetic steel components based on their magnetic response
- Abstract
- 23.1 Introduction
- 23.2 Non-destructive testing based on the magnetization mechanisms: the targeted properties
- 23.3 The magnetization mechanisms
- 23.4 Some examples of the link between the targeted properties and the magnetization mechanisms
- 23.5 Conclusion
- References
- Chapter 24. Cloud-based non-destructive characterization
- Abstract
- 24.1 Introduction
- 24.2 Backgrounds and basic definition
- 24.3 Industrial cloud computing
- 24.4 Cloud-based non-destructive testing and evaluation techniques
- 24.5 Challenges and opportunities in CNDCT
- 24.6 Case studies
- 24.7 Conclusion and viewpoints
- References
- Chapter 25. Complementary results of non-destructive elemental assay and liberation analysis of waste printed circuit boards
- Abstract
- 25.1 Introduction
- 25.2 Non-destructive characterization of the printed circuit board for selective liberation and enrichment of metals
- 25.3 Summary and future perspectives
- References
- Chapter 26. Future perspectives on non-destructive material characterization methods towards sustainability and circular economy
- Abstract
- 26.1 Introduction
- 26.2 Complexity and heterogeneity
- 26.3 Coupling multiple methods to capture material characteristics from different angles
- 26.4 Conclusions
- References
- Index
- No. of pages: 916
- Language: English
- Edition: 1
- Published: September 1, 2023
- Imprint: Elsevier
- Paperback ISBN: 9780323911504
- eBook ISBN: 9780323984782
AO
Akira Otsuki
Dr. Akira Otsuki is a Visiting Professor at Luleå University of Technology, and the Unit coordinator and leading professor of the unit “Mine Tailings” at Universidad Adolfo Ibáñez. He is a member of several academic societies as well as an editor of academic journals including ChemEngineering and Recycling. He also serves as a guest editor of special issues, including “Colloidal/Fine Particle Aspects of Mine Tailings”. His research focuses on characterization and processing of complex materials, including waste materials, natural ores, and colloids. He has been developing and running national and international research projects on his research focuses.
SJ
Seiko Jose
MM
Manasa Mohan
ST
Sabu Thomas
Sabu Thomas is a Senior Professor of Mahatma Gandhi University, Kottayam, Kerala, India, and also Chairman of the TrEST Research Park, Trivandrum, India. He is known for his outstanding contributions in polymer science and nanotechnology.