GaN Transistor Modeling for RF and Power Electronics
Using The ASM-HEMT Model
- 1st Edition - May 20, 2024
- Authors: Yogesh Singh Chauhan, Ahtisham Ul Haq Pampori, Sheikh Aamir Ahsan
- Language: English
- Paperback ISBN:9 7 8 - 0 - 3 2 3 - 9 9 8 7 1 - 0
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 9 9 9 4 0 - 3
GaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power ele… Read more
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Request a sales quoteGaN Transistor Modeling for RF and Power Electronics: Using The ASM-GaN-HEMT Model covers all aspects of characterization and modeling of GaN transistors for both RF and Power electronics applications. Chapters cover an in-depth analysis of the industry standard compact model ASM-HEMT for GaN transistors. The book details the core surface-potential calculations and a variety of real device effects, including trapping, self-heating, field plate effects, and more to replicate realistic device behavior. The authors also include chapters on step-by-step parameter extraction procedures for the ASM-HEMT model and benchmark test results.
GaN is the fastest emerging technology for RF circuits as well as power electronics. This technology is going to grow at an exponential rate over the next decade. This book is envisioned to serve as an excellent reference for the emerging GaN technology, especially for circuit designers, materials science specialists, device engineers and academic researchers and students.
- Provides an overview of the operation and physics of GaN-based transistors
- Features in-depth description (by the developers of the model) of all aspects of the industry standard ASM-HEMT model for GaN circuits
- Details parameter extraction of GaN devices and measurement data requirements for GaN model extraction
1. GaN Device Physics
2. GaN HEMT Models
Part II: ASM-HEMT Model
3. Surface Potential, 2DEG, and Drain Current Model
4. Self-Heating and Temperature Effects
5. Noise and Gate Current
Part III: ASM-HEMT for GaN Power Electronics
6. GaN Power Device Characterization
7. Terminal Charges and Capacitances
8. TCAD Simulation
9. Switching Collapse
Part IV: ASM-HEMT for GaN RF Electronics
10. Characterization of RF GaN HEMTs
11. RF Modeling-I
12. RF Modeling-II
Part V: Miscellaneous
13. Parameter Extraction
14. Model Quality Testing
- No. of pages: 425
- Language: English
- Edition: 1
- Published: May 20, 2024
- Imprint: Woodhead Publishing
- Paperback ISBN: 9780323998710
- eBook ISBN: 9780323999403
YC
Yogesh Singh Chauhan
Yogesh Singh Chauhan is a Chair Professor in the Department of Electrical Engineering at the Indian Institute of Technology Kanpur, India. He is the developer of several industry standard models: ASM-HEMT, BSIM-BULK (formerly BSIM6), BSIM-CMG, BSIM-IMG, BSIM4 and BSIM-SOI models. His research group is involved in developing compact models for GaN transistors, FinFET, nanosheet/gate-all-around FETs, FDSOI transistors, negative capacitance FETs and 2D FETs. His research interests are RF characterization, modeling, and simulation of semiconductor devices.
AP
Ahtisham Ul Haq Pampori
SA