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Elsevier

Fundamentals of Forensic Science

  • 3rd Edition - July 1, 2015
  • Latest edition
  • Authors: Max M. Houck, Jay A. Siegel
  • Language: English

Fundamentals of Forensic Science, Third Edition, provides current case studies that reflect the ways professional forensic scientists work, not how forensic academicians teach. Th… Read more

Description

Fundamentals of Forensic Science, Third Edition,

provides current case studies that reflect the ways professional forensic scientists work, not how forensic academicians teach. The book includes the binding principles of forensic science, including the relationships between people, places, and things as demonstrated by transferred evidence, the context of those people, places, and things, and the meaningfulness of the physical evidence discovered, along with its value in the justice system.

Written by two of the leading experts in forensic science today, the book approaches the field from a truly unique and exciting perspective, giving readers a new understanding and appreciation for crime scenes as recent pieces of history, each with evidence that tells a story.

Key features

  • Straightforward organization that includes key terms, numerous feature boxes emphasizing online resources,
    historical events, and figures in forensic science
  • Compelling, actual cases are included at the start of each chapter to illustrate the principles being covered
  • Effective training, including end-of-chapter questions – paired with a clear writing style making this an invaluable
    resource for professors and students of forensic science
  • Over 250 vivid, color illustrations that diagram key concepts and depict evidence encountered in the field

Readership

Advanced undergrad and graduate students in forensic science

Table of contents

Section I. Criminal Justice and Forensic Science

1. Introduction

2. Crime Scene Investigation

3. The Nature of Evidence

Section II. Analytical Tools

4. Microscopy

5. Light and Matter

6. Separation Methods

Section III. Biological Sciences

7. Pathology

8. Anthropology and Odontology

9. Entomology

10. Serology and Bloodstain Pattern Analysis

11. DNA Analysis

12. Forensic Hair Examinations

Section IV. Chemical Sciences

13. Illicit Drugs

14. Forensic Toxicology

15. Textile Fibers

16. Paint Analysis

17. Soil and Glass

18. Fires and Explosions

Section V. Physical Sciences

19. Friction Ridge Examination

20. Questioned Documents

21. Firearms and Toolmarks

22. Impression Evidence

23. Forensic Engineering

Section VI. Legal and Forensic Science

24. Digital Evidence and Computer Forensics

25. Legal Aspects of Forensic Science

Product details

  • Edition: 3
  • Latest edition
  • Published: July 1, 2015
  • Language: English

About the authors

MH

Max M. Houck

Dr. Max M. Houck is an internationally-recognized forensic expert with research interests in forensic science, education, and the forensic enterprise and its industries. He has worked in all aspects of forensic science, including at the FBI Laboratory. Dr. Houck has published widely in books and peer-reviewed journals. His anthropology and trace evidence casework includes the Branch Davidian Investigation, the September 11 attacks on the Pentagon, the D.B. Cooper case, the US Embassy bombings in Africa, and the West Memphis Three case, among hundreds of others. He served for six years as the Chair of the Forensic Science Educational Program Accreditation Commission (FEPAC). Dr. Houck is a Fellow of the Royal Society of Chemistry and a founding Co-Editor of the journal Forensic Science Policy and Management.
Affiliations and expertise
Vice President, Forensic and Intelligence Services, LLC, USA

JS

Jay A. Siegel

Jay Siegel, PhD is retired Director of the Forensic and Investigative Sciences Program and Chair of the Department of Chemistry and Chemical Biology at Indiana University Purdue University Indianapolis. He was Director of the Forensic Science Program at Michigan State University for 25 years from 1980-2004 until his retirement as Professor Emeritus. Dr. Siegel is a Distinguished Member of the American Academy of Forensic Sciences and was named as Distinguished Alumni Scholar by his alma mater, George Washington University in 2011. He is co-editor of Forensic Science Policy and Management: An International Journal. He was a member of the National Academy of Sciences Forensic Science Committee from 2006-09.
Affiliations and expertise
Director, Forensic and Investigative Sciences Program, Indiana University - Purdue University, Indianapolis, IN, USA

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