Fiber-Optic Measurement Techniques
- 2nd Edition - November 11, 2022
- Imprint: Academic Press
- Authors: Rongqing Hui, Maurice O'Sullivan
- Language: English
- Hardback ISBN:9 7 8 - 0 - 3 2 3 - 9 0 9 5 7 - 0
- eBook ISBN:9 7 8 - 0 - 3 2 3 - 9 1 5 5 3 - 3
Fiber Optic Measurement Techniques is an indispensable collection of key optical measurement techniques essential for developing and characterizing today’s photonic devices a… Read more
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Request a sales quoteFiber Optic Measurement Techniques is an indispensable collection of key optical measurement techniques essential for developing and characterizing today’s photonic devices and fiber optic systems. The book gives comprehensive and systematic descriptions of various fiber optic measurement methods with the emphasis on the understanding of optoelectronic signal processing methodologies, helping the reader to weigh up the pros and cons of each technique and establish their suitability for the task at hand.
Carefully balancing descriptions of principle, operations and optoelectronic circuit implementation, this indispensable resource will enable the engineer to:
- Understand the implications of various measurement results and system performance qualifications
- Characterize modern optical systems and devices
- Select optical devices and subsystems in optical network design and implementation
- Design innovative instrumentations for fiber optic systems
The 2nd edition of this successful reference has been extensively updated (with 150 new pages) to reflect the advances in the field since publication in 2008 and includes:
- A new chapter on fiber-based optical sensors and spectroscopy techniques
- A new chapter on measurement uncertainty and error analysis
Fiber Optic Measurement Techniques brings together in one volume the fundamental principles with the latest techniques, making it a complete resource for the optical and communications engineer developing future optical devices and fiber optic systems.
- The only book to combine explanations of the basic principles with latest techniques to enable the engineer to develop photonic systems of the future
- Careful and systematic presentation of measurement methods to help engineers to choose the most appropriate for their application
- The latest methods covered, such as real-time optical monitoring and phase coded systems and subsystems, making this the most up-to-date guide to fiber optic measurement
Optical and photonic engineers, R&D engineers, communications engineers, graduate students
Chapter 1, Fundamentals of optical devices
1.1, Laser diodes and LEDs
1.1.1, pn junction and energy diagram
1.1.2, Direct and indirect semiconductors
1.1.3, Carrier confinement
1.1.4, Spontaneous emission and stimulated emission
1.1.5, Light Emitting Diodes (LED)
1.1.6, Laser Diodes (LD)
1.1.7, Single frequency semiconductor lasers
1.1.8, Integrated tunable lasers (ITLA)
1.2, Photo-detectors
1.2.1, PN-junction photodiodes
1.2.2, Responsivity and bandwidth
1.2.3, Electrical Characteristics of a photodiode
1.2.4, Photo-detector noise and SNR
1.2.5, Avalanche photodiodes (APD)
1.2.6, Single-photon detectors
1.3, Optical fibers
1.3.1, Reflection and refraction
1.3.2, Propagation modes in optical fibers
1.3.3, Optical fiber attenuation
1.3.4 Group velocity and dispersion
1.3.5, Nonlinear effects in an optical fiber (add electrostriction within SBS)
1.4, Optical amplifiers
1.4.1, Optical gain, gain bandwidth and saturation
1.4.2, Semiconductor optical amplifiers
1.4.3, Erbium-doped fiber amplifiers (EDFA)
1.4.4, Distributed Raman amplification
1.5, External electro-optic modulator
1.5.1, Basic operation principle of electro-optic modulators
1.5.2 Frequency doubling and duo-binary modulation
1.5.3 Optical single-side modulation
1.5.4, Optical modulators using electro-absorption effect
1.5.5, I/Q modulation of complex optical field
Chapter 2 Basic Instrumentation for Optical Measurement
2.0 Introduction
2.1 Grating-base optical spectrum analyzers
2.1.1 General specifications
2.1.2 Fundamentals of diffraction gratings
2.1.3 Basic OSA configurations
2.2 Scanning FP interferometer
2.2.1 Basic FPI configuration and transfer function
2.2.2 Scanning FPI spectrum analyzer
2.2.3 Scanning FPI basic optical configurations
2.2.4 Optical spectrum analyzer using the combination of grating and FPI
2.3 Mach-zehnder interferometers
2.3.1 Transfer matrix of a 2 x 2 optical coupler
2.3.2 Transfer function of an MZI
2.3.3 MZI used as an optical filter
2.4 Michelson interferometers
2.4.1 Operating principle of a Michelson interferometer
2.4.2 Measurement and characterization of Michelson interferometers
2.5 Optical wavelength meter
2.5.1 Operating principle of a wavelength meter based on Michelson interferometer
2.5.2 Wavelength coverage and spectral resolution
2.5.3 Wavelength calibration
2.5.4 Wavelength meter based on Fizeau wedge interferometer
2.6 Optical ring resonators
2.6.1 Ring resonator transfer function
2.6.2 Techniques of increasing Q-values
2.6.3 Applications of ring resonators
2.6 Optical polarimeter
2.6.1 General description of lightwave polarization
2.6.2 The Stokes parameters and the Poincare sphere
2.6.3 Optical polarimeters
2.7 Measurement based on coherent optical detection
2.7.1 Operating principle
2.7.2 Receiver SNR calculation of coherent detection
2.7.3 Balanced coherent detection and polarization diversity
2.7.4 Phase diversity in coherent homodyne detection
2.7.5 Coherent OSA based on swept frequency laser
2.8 Waveform measurement
2.8.1 Oscilloscope operating principle
2.8.2 Digital sampling oscilloscopes
2.8.3 High speed real-time digital analyzer
2.8.3 High-speed sampling of optical signal
2.8.4 High-speed electric ADC using optical techniques
2.8.5 Oscilloscope base on single-photon detection
2.8.6 Short optical pulse measurement using an autocorrelator
2.9 Optical low-coherent interferometry → Optical Reflectometry
2.9.1 Direct-detection LIDAR systems
2.9.1 Optical low-coherence reflectometry
2.9.2 Fourier-domain reflectometry (add: complex-field LIDAR)
2.10 Optical network analyzer
2.10.1 S-parameters and RF network analyzer
2.10.2 Optical network analyzers
Chapter 3, Characterization of optical devices
3.1, Characterization of RIN and linewidth of semiconductor lasers
3.1.1, Measurement of relative intensity noise (RIN) (add normalization procedure)
3.1.2, Measurement of laser phase noise, frequency-dependent FM noise, and linewidth
3.2, Measurement of electro-optic modulation response
3.2.1 Characterization of intensity modulation response
3.2.2 Measurement of frequency chirp
3.2.3 Time-domain measurement of modulation-induced chirp
3.2.4 Bias point stabilization of an I/Q modulator
3.3, Wide-band characterization of an optical receiver
3.3.1, Characterization of photodetector responsivity and linearity
3.3.2, Frequency domain characterization of photodetector response
3.3.3, Photodetector bandwidth characterization using source spontaneous-spontaneous beat noise
3.3.4, Photodetector characterization using short optical pulses
3.3.5 Digital equalization of a optical transceiver transfer function (adaptive filter)
3.4, Characterization of optical amplifiers
3.4.1, Measurement of amplifier optical gain
3.4.2, Measurement of static and dynamic gain tilt
3.4.3, Optical amplifier noise
3.4.4, Optical domain characterization of ASE noise
3.4.5, Impact of ASE noise in electrical domain
3.4.6, Noise Figure definition and its measurement
3.4.7, Time domain characteristics of EDFA
3.4.8, Distributed Raman amplification in fiber-optic systems
3.5, Characterization of passive optical components
3.5.1, Fiber-optic couplers
3.5.2, Fiber Bragg-grating filters
3.5.3, WDM multiplexers and demultiplers
3.5.4, Optical isolators and circulators
Chapter 4, Optical fiber measurement
4.1, Classification of fiber types (add: new fibers such as AllWave, TeraWave, ...)
4.2, Measurement of fiber mode-field distribution
4.2.1, Near-field, far-field and mode field diameter
4.2.2 The far-field measurement techniques
4.2.3 The near-field measurement techniques
4.3, Fiber attenuation measurement, OTDR and OFDR
4.3.1, Cutback technique
4.3.2, Optical time-domain reflectometer
4.3.3 Improvement considerations of OTDR
4.3.4 OFDR: optical frequency domain reflectometry
4.4, Fiber dispersion measurements
4.4.1, Intermodal dispersion and its measurement
(1) Pulse distortion method
(2) Frequency domain measurement
4.4.2, Chromatic dispersion and its measurement
(1) Modulation phase shift method
(2) Baseband AM response method
(3) Interferometric method
(4) Measurement with a digital coherent receiver
4.5, Polarization Mode Dispersion (PMD) Measurement
4.5.1, Representation fiber birefringence and PMD parameter:
4.5.2, Pulse delay method
4.5.3, The Interferometric method
4.5.4, Poincare Arc Method:
4.5.4, Fixed Analyzer Method
4.5.6, The Jones-Matrix method
4.5.7, The Mueller-Matrix method
4.6, Determination of polarization-dependent loss
4.7, PMD sources and emulators
4.8, Measurement of fiber nonlinearity
4.8.1, Measurement of Stimulated Brilliouin Scattering Coefficient
4.8.2, Measurement of Stimulated Raman Scattering Coefficient
4.8.3, Measurement of Kerr-effect nonlinearity
Chapter 5, Fiber-based optical sensors and spectroscopy techniques
5.1, Overview of fiber-optic sensors
5.2, Stress and temperature sensors based on fiber Bragg gratings
5.3, Distributed fiber sensors based on Rayleigh and stimulated Brillion scattering
5.4, Optical frequency combs and their applications
5.4.1 Techniques to create optical frequency combs
5.4.2 Precision metrology based optical frequency combs
5.4.3 Dual-frequency combs and applications
5.5, Nonlinear spectroscopy and microscopy based on femtosecond fiber lasers
5.5.1 Femtosecond fiber lasers
5.5.2 Soliton-self-frequency shift
5.5.3 Two-photon microscopy based on fiber lasers
5.5.4 CARS and SRS based on wavelength swept femtosecond pulses
Chapter 6, Optical system performance measurements
6.1, Overview of fiber-optic transmission systems
6.1.1, Optical system performance considerations
6.1.2, Receiver BER and Q
6.1.3, System Q estimation based on eye diagram parameterization
6.1.4, Bit Error-rate Testing
6.2, Receiver sensitivity measurement and OSNR tolerance
6.2.1, Receiver sensitivity and power margin
6.2.2, OSNR margin and required OSNR (R-OSNR)
6.2.3, BER vs. decision threshold measurement
6.3, Waveform distortion measurements
6.4, Time jitter measurement
6.4.1, Basic jitter parameters and definitions
6.4.2 Jitter detection techniques
6.5 In-situ monitoring techniques of fiber-optic systems
6.5.1, In-situ monitoring of chromatic dispersion
6.5.2, In-situ PMD monitoring
6.5.3, In-situ PDL monitoring
6.6, pump-probe measurements
6.6 Pump-probe measurement techniques (XPM, FWM, Electrostriction)
6.7 System degradation measurements based on the required OSNR
7.7.1, Measurement of R-SNR due to chromatic dispersion
7.7.2, Measurement of R-SNR due to fiber nonlinearity
7.7.3, Measurement of R-SNR due to optical filter misalignment
6.8 Optical system performance monitors based on integrated optical circuits
6.9, Optical re-circulating loop
7.9.1. Operation principle of a recirculating loop
7.9.2. Measurement procedure and time control
7.9.3. Optical gain adjustment in the loop
Chapter 7, Measurement uncertainty and error analysis
7.1, Prologue
7.2, Specification and measurement
Measurement standard types
absolute errors
secondary errors
7.3. Sources of uncertainty in optical measurements
Systematic
Random
Guard bands
7.4. Error statistics and aggregation
Error distributions of single and multiple sources
Central limit Theorem
Error calculus
Correlated and uncorrelated errors
7.5. Reporting errors: Text and graphical
Functional extraction from measured data
Errors in extracted functional parameters
Linear system and Neural network examples
- Edition: 2
- Published: November 11, 2022
- No. of pages (Hardback): 846
- Imprint: Academic Press
- Language: English
- Hardback ISBN: 9780323909570
- eBook ISBN: 9780323915533
RH
Rongqing Hui
Rongqing Hui is a professor of Electrical Engineering and Computer Science at the University of Kansas, Lawrence, United States. His research interests are in lightwave communication systems and subsystems, photonic devices, optical instrumentation, and photonic sensors.
Affiliations and expertise
School of Engineering, University of Kansas, Lawrence, United StatesMO
Maurice O'Sullivan
Maurice O’Sullivan has engineered the physical layer of optical transmission for more than 30 years, at first in the optical cable business, developing factory-tailored metrology for optical fiber, but, mainly, in the optical transmission business developing, modeling and verifying physical layer designs and performance of Nortel's (now Ciena’s) line and highest rate transmission product including the first commercial 10 Gb/s system, several commercial terrestrial line systems, the first commercial DSP assisted electric field modulation transceiver with complete electronic compensation for optical dispersion and the first commercial coherent 40Gb/s and 100Gb/s transceivers. Now with Ciena, Maurice is engaged in the design of successive generations of flexible high capacity multi-rate coherent transceivers including 50G/100G/200G, 100G/…/400G, and 200G/…/800G products. Maurice is a Ciena Fellow with more than 45 patents and holds a Ph.D. in physics (high resolution spectroscopy) from the University of Toronto.
Affiliations and expertise
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