Developments in Surface Contamination and Cleaning, Volume 4
Detection, Characterization, and Analysis of Contaminants
- 1st Edition - September 26, 2011
- Authors: Rajiv Kohli, Kashmiri L. Mittal
- Language: English
- Hardback ISBN:9 7 8 - 1 - 4 3 7 7 - 7 8 8 3 - 0
- Paperback ISBN:9 7 8 - 0 - 1 2 - 8 1 0 3 6 8 - 5
- eBook ISBN:9 7 8 - 1 - 4 3 7 7 - 7 8 8 4 - 7
In this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and be… Read more
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Request a sales quoteIn this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contamination.
The expert contributions in this volume cover important fundamental aspects of surface contamination that are key to understanding the behavior of specific types of contaminants. This understanding is essential to develop preventative and mitigation methods for contamination control. The coverage complements the treatment of surface contamination in vol.1, Fundamental and Applied Aspects. This volume covers: Sources and Generation of Particles; Manipulation Techniques for Particles on Surfaces; Particle Deposition and Rebound; Particle Behavior in Liquid Systems; Biological and Metallic Contamination; and includes a comprehensive list of current standards and resources.
- Comprehensive coverage of innovations in surface contamination and cleaning
- Written by established experts in the contamination and cleaning field
- Each chapter is a comprehensive review of the state of the art
- Case studies included
Engineers and scientists involved in research and development, manufacturing, process and quality control, and procurement specifications across sectors including microelectronics, aerospace, optics, xerography and joining (adhesive bonding)
- Preface
- About the Editors
- Contributors
- Chapter 1. Basics and Sampling of Particles for Size Analysis and Identification
- 1. Introduction and basics
- 2. Sampling
- 3. Solvents and solubility parameters
- 4. Cleanroom airflows and their consideration in contamination sampling
- 5. Summary
- Chapter 2. Computational Fluid Dynamics of Particle Transport and Deposition
- 1. Introduction
- 2. Formulation
- 3. Applications
- 4. Conclusions
- Chapter 3. Methods for Monitoring and Measuring Cleanliness of Surfaces
- 1. Introduction
- 2. Types of Contaminants
- 3. Product Cleanliness Levels
- 4. Methods for Monitoring Surface Cleanliness
- 5. Summary
- Chapter 4. Size Analysis and Identification of Particles
- 1. Introduction
- 2. Particle Identification
- 3. Summary
- Chapter 5. Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features
- 1. Introduction
- 2. Impact of Contaminants
- 3. Nature and Size of Particles
- 4. Recent Developments in Characterization Techniques
- 5. Miscellaneous Innovative Applications of Characterization Methods
- 6. Summary
- Chapter 6. Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions
- 1. Introduction
- 2. AFM – Modes of Operation
- 3. Adhesion Forces
- 4. Application of AFM
- 5. Summary
- Index
- No. of pages: 352
- Language: English
- Edition: 1
- Published: September 26, 2011
- Imprint: William Andrew
- Hardback ISBN: 9781437778830
- Paperback ISBN: 9780128103685
- eBook ISBN: 9781437778847
RK
Rajiv Kohli
KM