
Condensed Matter
Applied Atomic Collision Physics, Vol. 4
- 1st Edition - December 1, 1983
- Imprint: Academic Press
- Editor: Sheldon Datz
- Language: English
- Paperback ISBN:9 7 8 - 1 - 4 8 3 2 - 0 5 2 6 - 7
- eBook ISBN:9 7 8 - 1 - 4 8 3 2 - 1 8 6 9 - 4
Applied Atomic Collision Physics, Volume 4: Condensed Matter deals with the fundamental knowledge of collision processes in condensed media. The book focuses on the range of… Read more

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Request a sales quoteApplied Atomic Collision Physics, Volume 4: Condensed Matter deals with the fundamental knowledge of collision processes in condensed media. The book focuses on the range of applications of atomic collisions in condensed matter, extending from effects on biological systems to the characterization and modification of solids. This volume begins with the description of some aspects of the physics involved in the production of ion beams. The radiation effects in biological and chemical systems, ion scattering and atomic diffraction, x-ray fluorescence analysis, and photoelectron and Auger spectroscopy are discussed in detail. The final two chapters in the text cover two areas of ion beam materials modification: ion implantation in semiconductors and microfabrication. This text is a good reference material for physics graduate students, experimental and theoretical physicists, and chemists.
List of Contributors
Treatise Preface
Preface
1 Heavy Ion Charge States
I. Introduction
II. Basic Processes and Mathematical Description of Charge Exchange
III. Experimental Aspects
IV. Electron Capture
V. Electron Loss
VI. Equilibrium Charge-State Distributions
VII. Gas and Solid Effects
References
2 Ionization Phenomena and Sources of Ions
I. Introduction
II. Ion Source Selection Considerations
III. Vapor Transport Methods
IV. Positive Ionization Phenomena and Sources
V. Negative Ionization Phenomena and Sources
VI. Ion Extraction and Optics of the Extraction Region
References
3 Radiation Physics as a Basis of Radiation Chemistry and Biology
I. What are the Problems of Radiation Physics?
II. Problems of Class I: How Do Radiations Degrade in Matter?
III. Problems of Class II: How Does Matter Change after Receiving Energy from Radiation?
IV. Some Notions of Radiation Chemistry and Biology
V. Concluding Remarks
References
4 Low Energy Ion Scattering and Atomic Diffraction
I. Ion Scattering Spectrometry (ISS)
II. Scattering of Atomic Beams at Thermal Energies
References
5 High Energy Ion Scattering
I. Introduction
II. Physics of Ion Scattering in Amorphous Solids
III. Atomic Composition of Surface Layers
IV. MeV Ion Scattering in Single Crystals
V. Structure Analysis in Crystalline Solids
VI. Summary
References
6 Inelastic Surface Collisions
I. Introduction
II. Ion-Induced Auger Spectra
III. Ion Neutralization at Surfaces
IV. Excitation of Projectiles
V. Optical Emission for Target Species
VI. Conclusion
References
7 Secondary Ion Mass Spectrometry
I. Introduction
II. The Sputtering Process
III. Sputtered Ion Emission: Phenomena and Models
IV. Instrumentation
V. Applications of Secondary Ion Mass Spectrometry
VI. Conclusion
References
8 The Time-of-Flight Atom Probe and Field Ion Microscopy
I. Introduction
II. Basic Principles
III. Field Ion Microscope and Atom-Probe FIM
IV. Atomic Processes on Solid Surfaces
V. Atom-Probe Analyses
VI. Summary
References
9 Ion-Induced X-Ray Emission
I. Introduction
II. Coulomb Ionization
III. Proton-Induced X-Ray Emission (PIXE)
IV. Heavy-Ion-Induced X-Ray Emission
References
10 X-Ray Fluorescence Analysis
I. Introduction
II. Development of the Physics
III. Development of the Analytical Application
IV. Comparison to Other Analytical Techniques
V. X-Ray Fluorescence Analysis in Industry
VI. Conclusions
References
11 Photoelectron and Auger Spectroscopy
I. Introduction
II. Description of the Processes
III. Experimental Considerations
IV. Applications
References
12 Ion Implantation in Semiconductors
I. Introduction
II. Depth Distributions in Implanted and Annealed Samples
III. Implantation Damage
IV. Electrical Activity
V. Recoil Implantation
VI. Annealing of Disorder by Irradiation
VII. Summary
References
13 Microfabrication
I. Introduction
II. Microfabrication Processes
III. Pattern Replication (Lithography)
IV. Pattern Transfer
V. Discussion
References
Index
- Edition: 1
- Published: December 1, 1983
- Imprint: Academic Press
- No. of pages: 646
- Language: English
- Paperback ISBN: 9781483205267
- eBook ISBN: 9781483218694
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