Back to School Savings: Save up to 30% on print books and eBooks. No promo code needed.
Back to School Savings: Save up to 30%
Atom Probe Tomography
Put Theory Into Practice
1st Edition - May 30, 2016
Editors: Williams Lefebvre, Francois Vurpillot, Xavier Sauvage
Hardback ISBN:9780128046470
9 7 8 - 0 - 1 2 - 8 0 4 6 4 7 - 0
eBook ISBN:9780128047453
9 7 8 - 0 - 1 2 - 8 0 4 7 4 5 - 3
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information… Read more
Purchase Options
Save 50% on book bundles
Immediately download your ebook while waiting for your print delivery. No promo code is needed.
Atom Probe Tomography
is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
Written for both experienced researchers and new users
Includes exercises, along with corrections, for users to practice the techniques discussed
Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Masters degree and Ph.D. students, Research engineers and senior scientists, University professors
Preface
List of Abbreviations
Chapter One. Early Developments and Basic Concepts
Introduction
Atom Probe Tomography in Materials Science Today
Basic Concepts
Concluding Remarks, the Specificities of Atom Probe Tomography
Chapter Two. Field Ion Emission Mechanisms
Introduction
Field Generation at the Surface of a Field Emitter
Field Emission at the Tip Surface From Electron Emission to Field Evaporation
Trajectories of Ions After Ionization or Field Evaporation in the Atom Probe
Conclusion
Chapter Three. Basics of Field Ion Microscopy
Introduction
Basic Principles
Field Ion Microscopy in Materials Science
Conclusion
Chapter Four. Atom Probe Sample Preparation
Specimen Preparation by Electropolishing
Sample Preparation Using Focused Ion Beam Milling
Conclusions
Chapter Five. Time-of-Flight Mass Spectrometry and Composition Measurements
Introduction
General Concepts and Definitions
Optimizing the Mass Spectrum in Atom Probe Tomography
Extracting Information From Mass Spectra
Chapter Six. Atom Probe Tomography: Detector Issues and Technology
Introduction
Microchannel Plate Assembly
Conventional Delay Line Detector
Conventional Measure of Timing Information
Accuracy of Conventional Delay Line Detector for Single Events
Coevaporation Effect
Accuracy of Conventional Delay Line Detector for Multiple Events
Advanced Delay Line Detector
Influence of Detection Systems Performances on Low-Angle Atom Probe Accuracy
Influence of Detection Systems on Atom Probe Accuracy in Wide-Angle AP
Effect of Multiple Events Detection on Composition
Conclusion
Chapter Seven. Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches
Classical Methods of Tomographic Reconstruction
A Few Words on Metrological Performances and Terminology
Spatial Precision
Improving Spatial Accuracy of APT Images
Conclusions and Perspectives
Chapter Eight. Laser-Assisted Field Evaporation
Introduction
Historical Background of Field Evaporation Assisted by Laser Pulses
Optical Properties of Nano Tips
Physical Mechanisms of Field Evaporation Assisted by Laser Pulses
Consequences on the La-APT Performances
Conclusions and Perspectives
Chapter Nine. Data Mining
Preliminary Definitions
Building the Tools
Relevance of the Approach as a Function of the Feature of Interest
Identifying the Bias
Conclusion
Chapter Ten. Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography
Motivations for a Correlative Approach
Relevant Techniques for a Correlative Approach
Experimental Protocols
Degradation of Specimen due to Observation in STEM
Correlation of Conventional TEM or BF-STEM and APT
Correlation of STEM Imaging and APT: Focus on the HAADF Mode
Correlation of Electron Tomography and APT
Correlative Microscopy in a Dedicated Instrument
Chapter Eleven. Combining Atom Probe Tomography and Optical Spectroscopy
Introduction
Relationships Between Chemistry, Structure, and Optics in Nanoscale Materials
Experimental Approaches
Appendix A
Appendix B
Index
No. of pages: 416
Language: English
Published: May 30, 2016
Imprint: Academic Press
Hardback ISBN: 9780128046470
eBook ISBN: 9780128047453
WL
Williams Lefebvre
Williams Lefebvre, Ph.D., is Associate Professor, Materials Physics Group, University of Rouen, France. He received his Ph.D. in Materials Science in Rouen in 2001 for his correlative analysis by transmission electron microscopy and atom probe tomography (APT) of phase transformations in titanium aluminides. He earned a fellowship to the Japan Society for the promotion of science in 2002, when he visited the NIMS of Tsukuba. Since 2014, he has also been a visiting adjunct research associate professor at the University of Nebraska, Lincoln, USA, where has has been leading research activities in the field of physical metallurgy, focusing on light alloys systems, aiming at improving the methodology associated with the investigation of early stages of precipitation by APT and scanning transmission electron microscopy.
Affiliations and expertise
Materials Physics Group, University of Rouen, France
FV
Francois Vurpillot
Francois Vurpillot, Ph.D., has been Assistant Professor, Materials Physics Group (GPM), University of Rouen, France since 2003. After receiving his Ph.D. at the GPM in 2001, he spent one year at the Department of Materials at the University of Oxford, as a post-doctoral researcher funded by a Marie Curie fellowship support. He is the current vice-president of the International Field Emission Society (IFES) and leader of the Instrumentation team at the GPM. Francois Vurpillot pioneered the combination of experimental and simulated data in APT, which has been a breakthrough in the development of the technique for the nano analysis in material science.
Affiliations and expertise
Materials Physics Group, University of Rouen, France
XS
Xavier Sauvage
Xavier Sauvage, Ph.D., Senior Scientist, Materials Physics Group, University of Rouen, France defended his Ph.D. at the University of Rouen in 2001. The topic was utilizing Atom Probe Tomography (APT) in the investigation of phase transformations in nanoscaled composites processed by severe plastic deformation. After a post-doc position at the Max Planck Institut of Stuttgart, he was hired as research scientist at the Materials Physics Group, University of Rouen to lead some research on nanostructured materials. Dr. Sauvage is now leader of the Materials under Extreme Nanostructures and Energy research team, in which atomic scale microscopy techniques are used for the investigation of fundamental mechanisms in materials under extreme conditions like irradiation or severe plastic deformation.
Affiliations and expertise
Materials Physics Group, University of Rouen, France