Limited Offer
Atom Probe Tomography
Put Theory Into Practice
- 1st Edition - May 30, 2016
- Editors: Williams Lefebvre, Francois Vurpillot, Xavier Sauvage
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 8 0 4 6 4 7 - 0
- eBook ISBN:9 7 8 - 0 - 1 2 - 8 0 4 7 4 5 - 3
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical informati… Read more
Purchase options
Institutional subscription on ScienceDirect
Request a sales quoteAtom Probe Tomography
is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.
- Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
- Written for both experienced researchers and new users
- Includes exercises, along with corrections, for users to practice the techniques discussed
- Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Masters degree and Ph.D. students, Research engineers and senior scientists, University professors
- Preface
- List of Abbreviations
- Chapter One. Early Developments and Basic Concepts
- Introduction
- Atom Probe Tomography in Materials Science Today
- Basic Concepts
- Concluding Remarks, the Specificities of Atom Probe Tomography
- Chapter Two. Field Ion Emission Mechanisms
- Introduction
- Field Generation at the Surface of a Field Emitter
- Field Emission at the Tip Surface From Electron Emission to Field Evaporation
- Trajectories of Ions After Ionization or Field Evaporation in the Atom Probe
- Conclusion
- Chapter Three. Basics of Field Ion Microscopy
- Introduction
- Basic Principles
- Field Ion Microscopy in Materials Science
- Conclusion
- Chapter Four. Atom Probe Sample Preparation
- Specimen Preparation by Electropolishing
- Sample Preparation Using Focused Ion Beam Milling
- Conclusions
- Chapter Five. Time-of-Flight Mass Spectrometry and Composition Measurements
- Introduction
- General Concepts and Definitions
- Optimizing the Mass Spectrum in Atom Probe Tomography
- Extracting Information From Mass Spectra
- Chapter Six. Atom Probe Tomography: Detector Issues and Technology
- Introduction
- Microchannel Plate Assembly
- Conventional Delay Line Detector
- Conventional Measure of Timing Information
- Accuracy of Conventional Delay Line Detector for Single Events
- Coevaporation Effect
- Accuracy of Conventional Delay Line Detector for Multiple Events
- Advanced Delay Line Detector
- Influence of Detection Systems Performances on Low-Angle Atom Probe Accuracy
- Influence of Detection Systems on Atom Probe Accuracy in Wide-Angle AP
- Effect of Multiple Events Detection on Composition
- Conclusion
- Chapter Seven. Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches
- Classical Methods of Tomographic Reconstruction
- A Few Words on Metrological Performances and Terminology
- Spatial Precision
- Improving Spatial Accuracy of APT Images
- Conclusions and Perspectives
- Chapter Eight. Laser-Assisted Field Evaporation
- Introduction
- Historical Background of Field Evaporation Assisted by Laser Pulses
- Optical Properties of Nano Tips
- Physical Mechanisms of Field Evaporation Assisted by Laser Pulses
- Consequences on the La-APT Performances
- Conclusions and Perspectives
- Chapter Nine. Data Mining
- Preliminary Definitions
- Building the Tools
- Relevance of the Approach as a Function of the Feature of Interest
- Identifying the Bias
- Conclusion
- Chapter Ten. Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography
- Motivations for a Correlative Approach
- Relevant Techniques for a Correlative Approach
- Experimental Protocols
- Degradation of Specimen due to Observation in STEM
- Correlation of Conventional TEM or BF-STEM and APT
- Correlation of STEM Imaging and APT: Focus on the HAADF Mode
- Correlation of Electron Tomography and APT
- Correlative Microscopy in a Dedicated Instrument
- Chapter Eleven. Combining Atom Probe Tomography and Optical Spectroscopy
- Introduction
- Relationships Between Chemistry, Structure, and Optics in Nanoscale Materials
- Experimental Approaches
- Appendix A
- Appendix B
- Index
- No. of pages: 416
- Language: English
- Edition: 1
- Published: May 30, 2016
- Imprint: Academic Press
- Hardback ISBN: 9780128046470
- eBook ISBN: 9780128047453
WL
Williams Lefebvre
FV
Francois Vurpillot
XS