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Analytical Techniques for Thin Films

Treatise on Materials Science and Technology, Vol. 27

1st Edition - March 28, 1988

Editors: K. N. Tu, R. Rosenberg

Language: English
eBook ISBN:
9 7 8 - 1 - 4 8 3 2 - 1 8 3 1 - 1

Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all… Read more

Analytical Techniques for Thin Films

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Treatise on Materials Science and Technology, Volume 27: Analytical Techniques for Thin Films covers a set of analytical techniques developed for thin films and interfaces, all based on scattering and excitation phenomena and theories. The book discusses photon beam and X-ray techniques; electron beam techniques; and ion beam techniques. Materials scientists, materials engineers, chemical engineers, and physicists will find the book invaluable.