Advances in Imaging and Electron Physics
- 1st Edition, Volume 179 - August 7, 2013
- Latest edition
- Editor: Peter W. Hawkes
- Language: English
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low en… Read more
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading authorities
- Informs and updates on all the latest developments in the field
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.
Editor-in-Chief
Preface
Future Contributions
Contributors
Chapter One. Invariant Quantum Wave Equations and Double Space-Time
1 Introduction
2 Dirac Equation
3 The Homogeneous Nonlinear Wave Equation
4 Invariance of Electromagnetic Laws
5 Electro-Weak and Electro-Strong Interactions
6 Other Consequences
7 Appendix A–Clifford Algebra
8 Appendix B–Calculations in Pauli Algebra
Acknowledgments
References
Chapter Two. In-Situ and Correlative Electron Microscopy: Proceedings of the Conference on In-Situ and Correlative Electron Microscopy (CISCEM), November 6–7, 2012, Saarbrücken, Germany
Introduction
Session 1 Studying Carbon-Based Materials
Session 2 Correlative Fluorescence and Electron Microscopy
Session 3 Electron Microscopy of Biological Specimens in their Native Environment
Session 4 Imaging Growth of Nanomaterials in Liquid
Session 5 In-Situ Studies of Electronic Materials and Metals
Session 6 Studying Electrochemistry with Liquid Cell Electron Microscopy
Session 7 Poster Session
Acknowledgments
Chapter Three. Electron Tweezers as a Tool for High-Precision Manipulation of Nanoobjects
1 Introduction
2 Theoretical Models
3 Experimental Schemes
4 Plasmon Resonances and Electron Beam Trapping of Nanoparticles
5 Outlook and Future Directions
Acknowledgments
References
Chapter Four. Robustness Analysis of the Reduced Fuzzy Texture Spectrum and its Performance on Noisy Images
1 Introduction
2 TS and FTS
3 Reduced TS and FTS Encodings
4 Performance of FTS versus TS
5 Conclusions
Acknowledgments
References
Chapter Five. Measure-by-Wire (MBW): An Automatic Control Framework for High-Throughput Transmission Electron Microscopy
1 Introduction
2 The Need for High-Throughput TEMs
3 The State of the Art in TEM Automation
4 A New TEM Paradigm: Measure-by-Wire
5 Examples of the MBW Approach
6 Conclusions
Acknowledgments
Appendix A Manual to Automated Operation Throughput Ratio
Appendix B Auto-Tuning Methods
Appendix C Estimation of the Second-Order Model Parameters
References
Contents of Volumes 151–178
Index
Color Plates
- Edition: 1
- Latest edition
- Volume: 179
- Published: August 7, 2013
- Language: English
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, FranceRead Advances in Imaging and Electron Physics on ScienceDirect